Discrete variational methods cluster models

IR, Raman, NMR, ESR, UPS, XPS, AES, EELS, SIMS) [1]. However, some industrial carbon materials such as amorphous carbon films and carbon black cannot be easily characterized from the local-structure point of view by these methods, because these materials usually take amorphous and complex structures. Recently, soft X-ray emission and absorption spectroscopy using highly brilliant synchrotron radiation [2] has been utilized to characterize various carbon materials, because information on both the occupied and unoccupied orbitals, which directly reflect the local structure and chemical states, can be provided from the high-resolution soft X-ray measurements. We have applied the soft X-ray spectroscopy to elucidate the local structure and chemical states of various carbon materials [3]. Additionally, we have successfully used the discrete variational (DV)-Xa method [4] for the soft X-ray spectroscopic analysis of the carbon materials, because the DV-Xa method can easily treat complex carbon cluster models, which should be considered for the structural analysis of amorphous carbon materials. 

The similarity and dissimilarity in physical properties between TiC and UC metal carbides have been studied using the nonrelativistic and relativistic discrete-variational (DV) Xa methods. To elucidate the nature of chemical bonding in the metal carbides, the valence electronic states for TiC and UC have been calculated using two cluster models. The following conclusions were obtained in the present study. 

The electronic state calculation by discrete variational (DV) Xa molecular orbital method is introduced to demonstrate the usefulness for theoretical analysis of electron and x-ray spectroscopies, as well as electron energy loss spectroscopy. For the evaluation of peak energy. Slater s transition state calculation is very efficient to include the orbital relaxation effect. The effects of spin polarization and of relativity are argued and are shown to be important in some cases. For the estimation of peak intensity, the first-principles calculation of dipole transition probability can easily be performed by the use of DV numerical integration scheme, to provide very good correspondence with experiment. The total density of states (DOS) or partial DOS is also useful for a rough estimation of the peak intensity. In addition, it is necessary lo use the realistic model cluster for the quantitative analysis. The... 

The discrete variational (DV) Xa method is applied to the study of the electronic structure of silicate glasses in embedded model clusters. The effects of the cluster size, the size of embedded imits, and the Si-0-Si bond angles on the electronic states are discussed. Embeddii units drastically improve the description of the electronic state, when compared to the isolated Si044- cluster, which is the structural unit of silicate glasses e.g., the Fermi energy for the embedded cluster becomes smaller when compared to that of the... 

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