Energy-dispersive diffractometry

The boron nitride obtained in this study was characterized by infrared spectroscopy, powder x-ray diffractometry and transmission electron microscopy. Trace elemental analyses were also performed by energy dispersive x-ray analysis and carbon arc emission spectroscopy. Representative spectra are displayed in Figures 2-4. 

Compared to the conventional method (single wavelength, moving counter), energy-dispersive diffractometry is much faster, because the diffraction pattern is acquired simultaneously rather than serially. Typically, the entire pattern can be recorded in 1 to 5 minutes, whereas the conventional technique requires over an hour. However, the resolution of closely spaced diffraction lines is inferior to that of the conventional technique. Also on the debit side are the added cost of an MCA and the inconvenience of cooling the Si (Li) counter. 

Fig. 7-23 Energy-dispersive diffractometry. (a) Experimental arrangement. The x-ray tube is seen end on. Diffracted-beam collimator not shown, (b) Diffraction pattern of polycrystalline platinum at 29 = 21.4° obtained with a Si(Li) counter and an iron-target x-ray tube operated at 45 kV and 8 mA. SWC = short wave cutoff = short-wavelength lintit of incident beam. Giessen and Gordon [7.20].

Energy-dispersive diffractometry has not yet been widely used. Prophecy is always risky, but it may turn out that this method will be most useful in process control, such as chemical analysis (Chap. 14), because it is fast, involves no counter movement, and is easily adapted to automation. 

A diffraction pattern of polycrystalline platinum is obtained by energy-dispersive diffractometry at 0 = 10.7°. Calculate the energy (in keV) at which the 2 2 0 line will appear and compare your result with Fig. 7-23(b). 

This second edition includes an account of new developments made possible by the semiconductor detector and pulse-height analysis, namely, energy-dispersive spectrometry and diffractometry. Applications of position-sensitive detectors are also described. 

In this work, we report on the preliminary results from the fabrication and characterization of Ni-AbOs membranes. The effect of sintering temperatures on membrane support was investigated. The fabricated membranes were characterized by X-ray diffractometry (XRD), scanning electron microscopy (SEM), energy dispersive X-ray spectrometer including X-ray mapping (EDS). In addition, the pore size and porosity were determined by Hg porosimetry. 

To identify nanoparticles there are several analytical techniques, including crystalline nature, surface plasmon resonance, size, shape, stability, nature, etc., which was done by various analytical instruments, such as UV-visible spectroscopy, X-ray diffractometry, Fourier transform infrared spectroscopy, scanning electron microscopy, transmission electron microscopy, energy dispersive analysis, zeta potential, etc. These are mostly used for analysis of synthesized nanoparticles, which helps us to study crystalline nature, functional groups, and morphological studies, and to identify its stability. 

An X-ray diffraction experiment has been carried out for a 3.9 mol% aqueous solution of TBA by means of energy-dispersive diffractometry (Nishikawa and lijima, 1984) [5] at room temperature. For comparison, a similar diffraction measurement has also been performed for pure water. 

The residual solid products of the complexes and the acetate mixtures decomposition was studied by means of powder X-ray diffractometry (XRD) with a DRON-4-07 apparatus (Ni-filtered CuKai-radiation, = 1.5405 A) and scanning electron microscopy (SEM) using a Zeiss SEM Ultra60 instrument equipped with an Inca Wave 500 Oxford energy dispersive X-ray microanalysis (EDX) system. 

Nishikawa, K lijima, T. (1984) Corrections for Intensity Data in Energy-dispersive X-Ray Diffractometry of Liquids. Application to Carbon Tetrachloride, Bull. Chem. Soc. pn. Vol. 57 1750-1759. 

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