Depth sensing indentation techniques

In general, the available indentation techniques are based either on scanning force microscopy (SFM) or on dedicated indentation setups providing well-defined tip geometries. The two approaches are described in Sections 8.2.1 and 8.2.2, respectively. Issues related to potential artifacts in IP characterization are discussed in Section 8.3. Finally, examples of epoxy IP characterization by means of SFM-based stiffness mapping as well as depth-sensing micro-indentation (DSI) are given in Sections 8.4.1 and 8.4.2, respectively. 

Depth sensing nanoindentation is a viable alternative to AFM beam bending for mechanical property measurements on polymer surfaces. The technique provides quantitative results owing to careful calibration of the system compliance and tip area/shape. It suffers from the high minimum load (about 1 iN) necessary for imaging prior to indenting. A new approach, which combines the best elements of both approaches, is still needed. 

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