Depth profile analytical procedure

Depth profiles of matrix elements on Mn- and Co-perovskite layers of fuel cathodes have been measured by LA-ICP-MS in comparison to other well established surface analytical techniques (e.g., SEM-EDX).118 On perovskite layers at a spatial resolution of 100p.m a depth resolution of 100-200 nm was obtained by LA-ICP-MS. The advantages of LA-ICP-MS in comparison to other surface analytical techniques (such as XPS, AES, SIMS, SNMS, GD-OES, GDMS and SEM-EDX) are the speed, flexibility and relatively low detection limits with an easy calibration procedure. In addition, thick oxide layers can be analyzed directly and no charging effects are observed in the analysis of non-conducting thick layers. 

It provides an optical depth profile of the absorption spectra, a unique analytical procedure. 

Once inside the analytical system there are many types of preparation or treatment of the specimen that might need to be carried out in the course of any one problem-solving procedure. They fall into the approximate categories of cleaning, depth profiling, interface exposure, and surface treatment. 

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