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Deflector plate

Figure Bl.23.5. Schematic illustration of tlie TOE-SARS spectrometer system. A = ion gun, B = Wien filter, C = Einzel lens, D = pulsing plates, E = pulsing aperture, E = deflector plates, G = sample, PI = electron multiplier detector with energy prefilter grid and I = electrostatic deflector. Figure Bl.23.5. Schematic illustration of tlie TOE-SARS spectrometer system. A = ion gun, B = Wien filter, C = Einzel lens, D = pulsing plates, E = pulsing aperture, E = deflector plates, G = sample, PI = electron multiplier detector with energy prefilter grid and I = electrostatic deflector.
The diameter should be sufficient to allow attenuation of the shock wave leaving the deflector plate. [Pg.2300]

The diameter should be sufficient to allow installation of the pipes and deflector plates in such a way as not to interfere directly with one another (particularly important for vertical vessels). [Pg.2300]

When the whole sample surface is irradiated by the exciting X-rays, an image can be obtained in a different way The spot accepted by the transferring lens system in front of the input of the CHA is rastered by introducing deflector plates in front of the lens system. Again, only electrons of a characteristic energy can pass the analyzer. This technique is realized with the Axis series. [Pg.22]

Deflector plate nozzle, 23 179 Deflocculants, ceramics processing, 5 647 Deflocculation, 22 56... [Pg.249]

On the assumption that the motion of the particle can be approximated by assuming a single deflection event in the middle of the plates, we can replace the ratio y// by d/L, where d is the measured deflection on the end of the tube and L is the distance of the end of the tube from the middle of the deflector plates, since from similar triangles these ratios are the same. Thus ... [Pg.223]

The entire region containing the source, the moderator and the deflector plate is electrically isolated from the rest of the beam line by a ceramic break, and it can be floated to an electrostatic potential of around 30 kV. Thus, the final beam energy can be varied up to 30 keV. Simpler systems, using only a carefully designed moderator region, can be used if lower beam energies (less than approximately 10 keV) are required. [Pg.22]

Figure 6 Isotope deflector plates in ion microprobe mass analyzer. Figure 6 Isotope deflector plates in ion microprobe mass analyzer.
The potential difference across R and C was amplified by a D.C. push-pull amplifier connected to XX, the output of which was applied to one pair of deflector plates of a cathode ray tube. The potential difference between the dropping electrode and the gauze electrode was similarly amplified and applied to the other pair of deflector plates. A negligible current flowed through the gauze electrode therefore its potential followed exactly that of the surrounding solution. By making... [Pg.301]


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See also in sourсe #XX -- [ Pg.332 ]




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