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Crystal, defect, point microscopic image

The resolution of the atomic force microscope depends on the radius of curvature of the tip and its chemical condition. Solid crystal surfaces can often be imaged with atomic resolution. At this point, however, we need to specify what Atomic resolution is. Periodicities of atomic spacing are, in fact, reproduced. To resolve atomic defects is much more difficult and usually it is not achieved with the atomic force microscope. When it comes to steps and defects the scanning tunneling microscope has a higher resolution. On soft, deformable samples, e.g. on many biological materials, the resolution is reduced due to mechanical deformation. Practically, a real resolution of a few nm is achieved. [Pg.166]


See other pages where Crystal, defect, point microscopic image is mentioned: [Pg.188]    [Pg.89]    [Pg.330]    [Pg.272]    [Pg.46]    [Pg.53]    [Pg.252]    [Pg.115]    [Pg.618]   
See also in sourсe #XX -- [ Pg.166 ]




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Crystallization points

Crystals point defects

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Defect point

Defects, microscopic

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