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Charge neutralization frequency

Any charge imbalance in a plasma (i.e. any local deviation from charge neutrality) results in a motion of tire electrons tliat, in turn, leads to oscillations of tire electrons witli tire electron plasma frequency C0p (Langmuir frequency)... [Pg.2795]

The interaction between a metal in contact with a solution of its ions produces a local change in the concentration of the ions in solution near the metal surface. This causes charge neutrality not to be maintained in this region, which can result in causing the electrolyte surrounding the metal to be at a different electrical potential from the rest of the solution. Thus, a potential difference known as the halfcell potential is established between the metal and the bulk of the electrolyte. It is found that different characteristic potentials occur for different materials and different redox reactions of these materials. Some of these potentials are summarized in Table 4.2. These half-cell potentials can be important when using electrodes for low-frequency or dc measurements. [Pg.72]

On the other hand, it is seen from Fig. 5.10 that only the higher-frequency optical mode is involved in C L,zz(fc,w). This is because only the rotational motions give rise to the local charge-density fluctuations. (The translational motions do not due to the charge-neutrality of the solvent molecule.) Thus it is the higher-frequency nature of the optical... [Pg.326]

The multiple energetic collisions cause molecules to break apart, eventually to form only atoms, both charged and neutral. Insertion of sample molecules into a plasma discharge, which has an applied high-frequency electric field, causes the molecules to be rapidly broken down into electronically excited ions for all of the original component atoms. [Pg.388]

Electrode surfaces in elec trolytes generally possess a surface charge that is balanced by an ion accumulation in the adjacent solution, thus making the system electrically neutral. The first component is a double layer created by a charge difference between the electrode surface and the adjacent molecular layer in the flmd. Electrode surfaces may behave at any given frequency as a network of resistive and capacitive elements from which an elec trical impedance may be measured and analyzed. [Pg.2437]

Boyd, BM Prausnitz, JM Blanch, HW, High-Frequency Altemating-Cross-Field Gel Electrophoresis with Neutral or Shghtly Charged Interpenetrating Networks to Improve DNA Separation, Electrophoresis 19, 3137, 1998. [Pg.609]

Much less is known about the charge states of muonium in silicon that are not neutral. The most likely ones of these are the positive and negative charge states, Mu+ and Mu. Both would have an even number of electrons and hence would quite likely be electronically diamagnetic. They presumably contribute to the p.SR line, usually labelled p+, which occurs at the Larmor frequency of a bare muon. Little else is known about these charge states other than that at high temperatures at least one of them is formed from neutral muonium, Mu and Mu. ... [Pg.594]

In summary, the covalent/ionic-resonance picture can be used to describe the entire range of neutral and charged H-bonding phenomena. The NRT resonance weights (wcov and / , ) and bond orders (6a—h and 6b...h) are correlated in the expected manner with bond lengths, IR frequencies, intermolecular charge transfer, and other properties. [Pg.624]

Prior to addressing the results of simulations on the issues exposed in the last section, we will now develop in this section a simple model perspective [5c,21,22,43]. Its purpose is both to shed light on the interpretation in terms of solvation of those results and to emphasize the interconnections (and differences) that may exist. The development given below is suitable for charge transfer reaction systems, which have pronounced solute-solvent electrostatic coupling it is not appropiate for, e.g., neutral reactions in which the solvent influence is mainly of a collisional character. (Although we do not pursue it here, the various frequencies that arise in the model can be easily evaluated by dielectric continuum methods [21,431). [Pg.238]


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See also in sourсe #XX -- [ Pg.375 ]




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