Brewster angle infrared monolayer

In this study, the layered structure of the organotiichlorosilane monolayer with a vinyl end group was constructed by the Langmuir method and its structure was analyzed by X-ray reflectivity (XR), Brewster angle Fourier transform infrared (B-FT-IR) spectroscopic measurements (14), electron diffraction (ED) and scanning force microscopic (SFM) observations. Furthermore, the domain height of the (NTS/FOETS) mixed monolayer surface with phase-separated structure was controlled by the combined method of Langmuir and chemisorption methods. 

Brewster angle IR spectroscopic measurement (14) was performed to evaluate the formation of layered structure in the NTS multilayer films. The NTS monolayer was transferred onto double mirror polished silicon wafer substrate. The incident angle of p-polarized infrared beam was 73.7" (the Brewster angle of interface between silicon wafer and air) in order to eliminate the multiple reflection of the infrared beam within the silicon wafer substrate. The spectra were recorded at a resolution of 4 cm" ... 

Application of advanced microscopic and spectroscopic methods, such as Brewster Angle Microscopy (BAM), Infrared Reflection-Adsorption Spectroscopy (IRRAS) and Grazing Incidence X-ray Dififaction (GIXD) at the monolayer revealed that when two lipid phases coexist, only the disordered liqnid-expanded phase is affected by the ions. Table I snm-marises GIXD results for the crystal cell parameters of the ordered liquid-condensed phase. These results prove that the ordered DPPC phase is not strongly affected by salts even at high salt concentrations. 

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