Beam-bending method

A relation between the surface stress and the structural change within the Pb UPD layer on Au film electrode has been studied, applying a bending beam method [487]. A maximum in the surface stress versus potential dependence emerged at the onset of UPD, similarly as in electrocapillary curve. 

Bending beam method — The principles of the bending beam ( bending cantilever , laser beam deflection wafer curvature ) method were first stated by Stoney [i], who derived an equation relating the stress in the film to the radius of curvature of the beam. The bending beam method can be effectively used in electrochemical experiments, since the changes of the surface stress... 

Bending beam method — Figure. Scheme of the electrochemical (optical) bending beam setup... 

Stoney s equation bending beam method Stranski, Iwan Nicola... 

Waver curvature method -> bending beam method Weighted digital filtering digital filter... 

Bending beam method for stress of oxide film on the surface Micropatterned samples for determination of carrier distribution and lateral mobility across the electrode or near the surface ... 

The most commonly used direct method for determination of surface stress is the bending beam method in which a lever bends when subjected to a change in surface stress in one of its faces in order to minimize its stored strain energy. The relationship between the deflection of a cantilever and the different stresses in its smfaces was first determined by Stoney [25] and in surface science it has been used to measure the stress changes associated with the reconstructions of semiconductor surfaces [26 - 27]. 

The electrocapillary curve of a solid metal electrode is more difficult to measure than that of a liquid electrode, because of problems of surface cleanliness. The most widely used approach has been the bending-beam method, which was originally developed by Fredlein et al. [28] using large samples. More recently Raiteri and Butt [29] have used gold electrodes deposited on an AFM cantilever to record electrocapillary curves. 

With bending-beam methods, the deflection of the free end of a one-side clamped substrate strip or the central deflection of a two-sided clamped strip is measured, which is produced under the influence of the film stress. The strip or beam length is often ten times its width. The deflection is detected either optically, mechanically or electrically. The sensitivity achievable depends to a large extent on the system of detection. Highest sensitivities are achieved with optical and electrical detectors. The radius of curvature of the substrate beam is calculated from ... 

Pei Q, Inganas O (1992) Electrochemical applications of the bending beam method. 1. Mass-transport and volume changes in polypyrrole during redox. J Phys Chem 96 10507... 

Pei, Q., and O. Inganas. 1993. Electrochemical applications of the bending beam method a novel way to study ion transport in electroactive polymers. Solid State Ionics 60 161. 

Pei Q, Inganaes O (1993) Electrochemical applications of the bending beam method. 

Waver curvature method bending beam method... 

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