Ballistic electron emission microscopy

Further advances will come by combination of STM with other forms of spectroscopy and scanning probe microscopy. One such emerging method that allows researchers to see beneath the surface of samples is ballistic electron emission microscopy (BEEM).159... 

BEEM BOMD Ballistic Electron Emission Microscopy Bohr-Oppenheimer Molecular Dynamics... 

A.C. Perrella, W.H. Rippard, P.G. Mather, M.J. Plisch, R.A. Buhrman, Scanning tunneling spectroscopy and ballistic electron emission microscopy studies of aluminum-oxide surfaces. Phys. Rev. B 65(20), 201403 (2002)... 

Direct investigation of subsurface interface electronic stmcture by ballistic-electron-emission microscopy. Phys. Rev. Lett., 60, 1406-1409. 

Fig. 40. Ballistic emission electron microscopy, (a) Electrons are tunneling at a high voltage out of the tip into the thin metal layer. A small fraction of hot electrons ballistically penetrate the sample. They are collected at the rear ohmic contact of the sample. 0 ) STM (top) and BEEM (bottom) images of an Au/GaAs Schottky contact. Dark regions in BEEM correspond to areas with no collector current (after [186]).

SWNTs also exhibit enhanced electronic properties, which include near ballistic transport (4,35-40). Therefore, SWNTs are investigated for a wide variety of potential apphcations, including conductive and high-strength composites, paint additives, nanoscale test tubes (41,42), hydrogen storage media (43,44), batteries (45), field emission materials (43,46-52), tips for scanning probe microscopy (53-59), transistors (60), diodes (61), and sensors (1, 2,18,40,62-72). 

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