Ballistic Electron Emission Microscopy BEEM

Further advances will come by combination of STM with other forms of spectroscopy and scanning probe microscopy. One such emerging method that allows researchers to see beneath the surface of samples is ballistic electron emission microscopy (BEEM).159... [Pg.131]

BEEM BOMD Ballistic Electron Emission Microscopy Bohr-Oppenheimer Molecular Dynamics... [Pg.218]

Fig. 40. Ballistic emission electron microscopy, (a) Electrons are tunneling at a high voltage out of the tip into the thin metal layer. A small fraction of hot electrons ballistically penetrate the sample. They are collected at the rear ohmic contact of the sample. 0 ) STM (top) and BEEM (bottom) images of an Au/GaAs Schottky contact. Dark regions in BEEM correspond to areas with no collector current (after [186]).

$Fig. 40. Ballistic emission electron microscopy, (a) Electrons are tunneling at a high voltage out of the tip into the thin metal layer. A small fraction of hot electrons ballistically penetrate the sample. They are collected at the rear ohmic contact of the sample. 0 ) STM (top) and BEEM (bottom) images of an Au/GaAs Schottky contact. Dark regions in BEEM correspond to areas with no collector current (after [186]).$

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