Auger lifetime

Auger lifetime Auger spectroscopic Auger spectroscopy... 

K-shell Auger lifetime variation in doubly ionized Ne and first-row hydrides... 

I,/tj (subscript) Auger lifetime, intrinsic Auger N.,N,. N, Acceptor, donor, trap concentra-... 

One of the problems on Auger recombination is connected with the expansion of the analytical expression of Beattie and Landsberg to degenerate semiconductor. A body of papers is dedicated to accurate calculation of Auger lifetime and overlap integrals for various materials and different degrees of degeneration [48, 49]. 

In order to present some basic expressions for the Auger lifetime let us denote Auger generation (impact ionization) rate as Ga and Auger recombination rate as Ra- We consider first the Auger 1 process. Since two electrons and one hole take part in it, the recombination rate will be proportional to n p... 

According to the approach of Beattie and Landsberg [31], the intrinsic Auger lifetime is calculated by perturbation method. The perturbation operator of Auger mechanism, i.e., of Coulomb interaction of two electrons, is calculated by subtracting Hartree-Fock single-electron Hamiltonian from the complete Hamiltonian of the system (and actually the simplest Hamiltonian that still sees the Coulomb interaction of the Auger process). It has the form of a screened Coulomb potential... 

The Auger lifetime is calculated according to the definition (1.17), so that... 

All of the quoted simplification introduce an error below 10 % into the calculated value of the Auger lifetime. Gerhardts et al. used the above expression to calculate Auger lifetime and obtained a satisfactory agreement with experiment [40]. 

There are various approximations in literature for intrinsic Auger lifetime for the CCCH process for the case of parabolic bands and nondegenerate semiconductor. The most often met is... 

The ration of intrinsic Auger lifetimes for Auger 1 and Auger 7 processes is approximately [41]... 

For each temperature and bandgap there is a threshold electron concentration for which the lengthening of Auger lifetime in comparison to nondegenerate case becomes marked. Figure 1.5 shows this concentration versus temperature, calculated here for Yigi with Eg = 0.1 eV (i.e., for various cadmium molar... 

Fig. 1.6 Temperature dependence of total Auger lifetime for Hgi tCd tTe with a cadmium molar fraction r = 0.195 for different electron concentrations...

Figure 1.6 shows total Auger lifetime versus reciprocal temperature for various electron concentrations. The dependence was calculated according to (1.43), (1.45), and (1.48-1.51). Material was again mercury cadmium telluride, with x = 0.195. 

For sufficiently high fields the response time becomes shorter than the Auger lifetime and the device effectively operates in the transit time limited mode. 

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