Auger elections

Palmbetg, P. W., Riach, G.E., Weber, R.E., McDonald, N.C. Handbook of Auger Election Spectroscopy. Edina, Minn. Physical Electronics Industries Inc. 1976... 

Figure 9.10. Auger election spectra of Ti-5Al-2.5Sn surfaces spectrum a, after impact fracture in vacuum spectrum b, after exposure to 5.3 x 10 Pa-s (4 X 10 torr-s) water vapor spectrum c, after exposure to 5.3 X 10 Pa-s (4 x 10 torr-s) oxygen spectrum d, after exposure to water vapor at 1.33 kPa (10 torr) (Ej, = 2 KeV, 3 eV peak-to-peak, Ip = 20 /xA) [6].

S. Rambert and D. Landolt, /Anodic dissolution of binary single phase alloys. I. Surface composition changes on Ag-Pd studied by Auger election spectroscopy, Electrochim. Acta3l Ul (1986). 

N K-edge X-ray absorption near edge stracture (XANES) spectra of the samples were measured at the BL-8B1 station of UVSOR-n at the Institute for Molecular Science, Okazaki, Japan. Data were recorded at room temperature in total electron yield mode, and the X-ray energy dependence of the N Auger election yield was monitored. Considering the escape depth of the Auger electrons, the spectra probe the sample fiom the surface up to a few nanometers in depth. 

Fig. 17. (a) Augei election spectrum presented in derivative mode for contaminated Cu surface, (b) Auger electron spectmm presented in direct intensity... 

Quantitation of Auger spectra follows the same lines of reasoning as discussed above for quantitation of xps data (19,27). Thus, the current due to Augei elections at a particular kinetic energy, I, is given by... 

In contrast to the TEM, the SEM can easily observe nearly any reasonably sized sample and furnish the chemical mi-croscopist with much information with little effort. Primary signals generated in an SEM are secondary electrons (SE), backscattered electrons (BSE), characteristic X rays, X-ray continuum. Auger electrons (AE), low-loss electrons (LLE), election energy loss (EEL), and transmitted electrons. Of value to the chemical microscopist are primarily the SE, BSE, and X-ray spectmm. 

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