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Noncontact atomic force microscopy

Perez R, Payne M C, Stich i and Terakura K 1997 Roie of covaient tip-surface interactions in noncontact atomic force microscopy on reactive surfaces Phys. Rev. Lett. 78 678... [Pg.1725]

Nakagiri N, Suzuki M, Okiguchi Kand Sugimura FI 1997 Site discrimination of adatoms in Si(111)-7 7 by noncontact atomic force microscopy Surf. Sc/. 375 L329... [Pg.1725]

Fukui K, Onishi H and Iwasawa Y 1997 Atom-resolved image of the 7102(110) surface by noncontact atomic force microscopy Phys. Rev. Lett. 79 4202... [Pg.1726]

Fukui, K. and Iwasawa, Y. (2002) Noncontact Atomic Force Microscopy (eds S. Morita, E. Meyer, and R. Wiesen-danger), Springer, Berlin. [Pg.237]

Abe, M., Sugimoto, Y. and Morita, S. Imaging the restatom of the Ge(lll)-c(2 x 8) surface with noncontact atomic force microscopy at room temperature. Nanotechnology 16, S68-S72... [Pg.381]

Mclntire, T.M., Brant, D.A. (1997). Imaging of individual biopolymers and supramole-cular assemblies using noncontact atomic force microscopy. Biopolymers, 42, 133-146. [Pg.226]

E. Meyer (Eds.), Noncontact Atomic Force Microscopy. Springer-Verlag, Berlin, 2002. [Pg.215]

Morita S, Wisendanger R, Meyer E (eds) (2002) Noncontact atomic force microscopy. Springer, Berlin... [Pg.473]

Rensen WHJ, van Hulst NE, Ruiter AGT, West PE (1999) Atomic steps with tuning-fork-based noncontact atomic force microscopy. Appl Phys Lett 75 1640... [Pg.473]

Noncontact atomic force microscopy, eds. S. Morita, R. Wiesendanger, E. Meyer,... [Pg.361]

Mclntire, T. M., Brant, D. A. (1998). Observations of the (1- 3)—D-glucan linear triple helix to macrocycle interconversion using noncontact atomic force microscopy, /. Am. Chem. Soc., 120 6909. [Pg.540]

Proceedings of the Second International Workshop on Noncontact Atomic Force Microscopy (R. Benewitz, Ed.). Appl. Surf. Sci. 157 (2000). [Pg.108]

Molecular-scale imaging in FFM [46, 81], PFM-AFM [82], noncontact atomic force microscopy (nc-AFM) [83-88] and anisotropy in friction and molecular stick-shp motion [89] have been discussed. Other important issues in CFM are chiral discrimination [90-92] and calibration of AFM cantilever spring constants [67,93, 94] and tip radii [39, 95]. [Pg.6489]

A. Checco, H. Schollmeyer, J. Daillant, P. Guenoun, and R. Boukherroub, Nanoscale wettability of self-assembled monolayers investigated by noncontact atomic force microscopy, Langmuir, 22,116-126, (2006). [Pg.137]

R. Garcia, M. Calleja, and H. Rohrer, Patterning of silicon surfaces with noncontact atomic force microscopy field-induced formation of nanometer-size water bridges,/. Appl. Phys., 86,1898-1903 (1999]. [Pg.356]

M. Calleja, M. Tello, and R. Garcia, Size determination of field-induced water menisci in noncontact atomic force microscopy, J. Appl. Phys., 92, 5539-5542 (2002). [Pg.524]

S. Kitamura and M. Iwatsuki, Observation of 7 7 reconstructed structure on the silicon (111) surface using ultrahigh vacuum noncontact atomic force microscopy, Jpn.J. Appl. Phys. Part II. 34, L145 (1995). [Pg.710]

T. Ichii, H. Kawabata, T. Fukuma, K. Kobayashi, H. Yamada, and K. Matsushige, Molecular-scale investigations of semi-insulating polymer single crystals by noncontact atomic force microscopy. Nanotechnology. 16,522 (2005). [Pg.710]

Fukui K, Namai Y, Iwasawa Y Imaging of surface oxygen atoms and their defect structures on Ce02(lll) by noncontact atomic force microscopy, Appl Surf Sci 188 (3) 252-256, 2002. [Pg.54]

Sadewasser, S. and Lux-Steiner, M.C. (2003) Correct height measurement in noncontact atomic force microscopy. Phys. Rev. Lett., 91, 266101. [Pg.479]

Rahe, P., Bechstein, R., Schiitte, )., Ostendorf, F., and Kuhnle, A. (2008) Repulsive interaction and contrast inversion in noncontact atomic force microscopy imaging of adsorbates. [Pg.480]

Perez, R., Stich, 1., Payne, M.C., and Terakura, K. (1998) Surface-tip interactions in noncontact atomic-force microscopy on reactive surfaces ... [Pg.480]

Giessibl, F.J. (2000) Atomic resolution on Si(lll)-(7 X 7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork. Appl. Phys. Lett., 76, 1470-1472. [Pg.481]

Arai, T. and Tomitori, M. (2000) Bias dependence of Si(lll)7 X 7 images observed by noncontact atomic force microscopy. Appl. Surf. Sci., 157, 207-211. [Pg.481]


See other pages where Noncontact atomic force microscopy is mentioned: [Pg.155]    [Pg.174]    [Pg.163]    [Pg.6122]    [Pg.55]    [Pg.194]    [Pg.74]    [Pg.449]    [Pg.481]   


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