Atomic force microscopy topographic

FIGURE 31-18 Comparison of conventional atomic force microscopy topographic image (a) with thermal image (b) of a paracetamol pharmaceutical tablet. (Reprinted from H. M. Pollock and A. Hammiche, J. Phys. D. Appl. Phys., 2001,34, R23. With permission.)... 

Fig. 2.7 The topographic view of a photobleached waveguide using atomic force microscopy (a), and the height profile along three scan lines (b). Reprinted from Ref. 15 with permission. 2008 Institute of Electrical and Electronics Engineers...

Powerful methods that have been developed more recently, and are currently used to observe surface micro topographs of crystal faces, include scanning tunnel microscopy (STM), atomic force microscopy (AFM), and phase shifting microscopy (PSM). Both STM and AFM use microscopes that (i) are able to detect and measure the differences in levels of nanometer order (ii) can increase two-dimensional magnification, and (iii) will increase the detection of the horizontal limit beyond that achievable with phase contrast or differential interference contrast microscopy. The presence of two-dimensional nuclei on terraced surfaces between steps, which were not observable under optical microscopes, has been successfully detected by these methods [8], [9]. In situ observation of the movement of steps of nanometer order in height is also made possible by these techniques. However, it is possible to observe step movement in situ, and to measure the surface driving force using optical microscopy. The latter measurement is not possible by STM and AFM. 

Fig. 10.7 Topographical (left) and equivalent processed (right) images from atomic force microscopy (AFM) of...

The relatively novel method of atomic force microscopy can be used both ex situ and in situ for the study of the surface morphology of electrodes. It is based on a thin and sensitive cantilever to which a sharp microscopic tip is attached. The tip is raster-scanned along the studied surface, changing its deflection as a result of topographic changes. The deflection is measured by a laser beam which is reflected from the back of the cantilever to a detector that measures the position... 

The lateral chemical and topographical resolution of the morphology was investigated with atomic-force microscopy (AFM) and X-ray photoemission electron microscopy (XPEEM). 

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