Anodized photomicrograph

Figure C shows an electron photomicrograph of a broken planar SOFC. The thick portion on the left is the porous anode structure. This is an anode-supported cell, meaning that in addition to collecting current and supporting the anode reaction, the anode layer stiffens the whole cell. The layer on the right is the cathode, and the interface between the two is the thin electrolyte. One of the challenges of this design is to ensure that the rates of expansion of the cathode and the anode match. If the anode expands faster than the cathode, the planar cell tends to curl like a potato chip when the temperature changes.

XPS spectra were obtained using a Perkin-Elmer Physical Electronics (PHI) 555 electron spectrometer equipped with a double pass cylindrical mirror analyzer (CMA) and 04-500 dual anode x-ray source. The x-ray source used a combination magnesium-silicon anode, with collimation by a shotgun-type collimator (1.). AES/SAM spectra and photomicrographs were obtained with a Perkin-Elmer PHI 610 Scanning Auger Microprobe, which uses a single pass CMA with coaxial lanthanum hexaboride (LaBe) electron gun. 

FIGURE 14. STEM photomicrographs of (a) a sodium hydroxide anodized surface (100,000 x) and (b) a pickled sodium hydroxide anodized surface (100,000x). (From Reference 19.)... 

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