Annealing phenomena

Polyethylene crystals are observed to thicken at temperatures greater than 110°C, and if grown under isothermal conditions show this thickening 

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Humphreys, F.J. and Hatherly, M. (1995) Recrystallization and Related Annealing Phenomena (Pergamon Press, Oxford) p. 3. 

Possible sites for the hydrogen anneal phenomena might be surface states, for example, on either side of the native oxide on top of the SiC surface. However, lattice defects and contamination in the surface layer of the epilayer may also be involved, as indicated in the 1/C curves. These may be on different sides of the thin insulator between the metal and the SiC. The thin insulator in these samples is probably a thin native oxide, SiO and oxidized Ta, Ta O, from the TaSi layer. 

In the next section we will consider some recent results of Szilard-Chalmers studies against the background of the various models and in the third section we will treat annealing phenomena in some detail. 

Recrystallization and Related Annealing Phenomena by F. J. Humphreys and H. Hatherly, Pergamon Press, Oxford England, 1996. A useful discussion of the connection between observed macroscopic changes in microstructure and the underlying defect mechanisms that engender it. 

Gold R, Roberts JH, Ruddy F (1981) Annealing phenomena in solid state track recorders. Nucl Tracks 5 253-264... 

Balta-Calleja and Peterlin [210] investigated annealing phenomena of drawn polypropylene. They found that the relaxation of tie molecules, shrinkage, and disorientation proceeded relatively fast, compared with the long period growth and the increase in density, which continued as a linear function of log time through 1000 min. 

Freezing and Annealing Phenomena in Lyophilization James A. Searles... 

T Randolph, J Searles. Freezing and annealing phenomena in lyophilization effects upon primary drying rate, morphology, and heterogeneity. American Pharmaceutical Review 5 40-46, 2002. 

F.J. Humphreys, M. Hatherly, Reciystallization and related annealing phenomena,... 

The mobility and migration of boundaries, in Recrystallization and Related Annealing Phenomena (Second Edition), F. J. Humphreys and M. Hatherly, Elsevier, New York, 2004,121. 

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