Angle-resolved x-ray photoelectron spectroscopy

Yamamoto, H., Butera, R. A., Gu, Y. and Waldeck, D. H. Characterization of the surface to thiol bonding in self-assembled monolayer films of C12H25SH on InP(100) by angle-resolved X-ray photoelectron spectroscopy. Langmuir 15, 8640 (1999). 

Fig. 3. (a) Steady-state depth composition profile of an originally crystalline silicon surface that has been exposed to a chlorine plasma, obtained from angle-resolved X-ray photoelectron spectroscopy, (b) Corresponding side-view schematics of near-surface atomic coordination left, 280-eV ions right, 40-eV ions. (From Layadi et al., 1997.)... 

Two different stages for silver deposition on platinum can be described one at 1.1 V vs. RHE responding to a silver-platinum alloy electrodissolution (overlapped with the oxygen electroadsorption at free platinum sites) and the other at 0.65 V due to the silver oxidation (from the onset of the bulk deposition process) deposited on the former surface alloy [88,89]. The former process splits into two peaks when the potentiostatic ageing is performed. The spectroscopic techniques such as XPS and ARXPS (angle resolved x-ray photoelectron spectroscopy) were used to determine the chemical composition of the silver films on the platinum in an acid solution [92], The technique was not able to discern between the presence of silver oxides and sulfates, only an energy shift of the clean silver 3d5/2 band at a upd level of —0.5 eV was detected. 

C.S. Fadley. Angle Resolved X-Ray Photoelectron Spectroscopy. Prog. Surf. Sci. 16 275 (1984). 

Acronyms XPS or XPES X-ray photoelectron spectroscopy, ESCA electron spectroscopy for chemical apphcations (originally analysis), PESIS photoelectron spectroscopy of inner shell, ARXPS angle resolved X-ray photoelectron spectroscopy. 

UHV analysis can also be applied. Angle resolved x-ray photoelectron spectroscopy (ARXPS) also allows the determination of the film thickness. The method uses the fact that the ratio between the aluminum oxide peak and the peak of the metalKc aluminum changes with angle of incidence since the length of path in the oxide increases for a grazing incidence [70, 71]. 

Equation (22) is particularly useful when a concentration gradient in depth exists. In this case, several spectra at different values of 9 are taken and the analysis is called angle resolved X-ray photoelectron spectroscopy. However, for a maximum efficiency, a flat surface (at an atomic level) is needed to avoid shade effects as shown by Fadley in his early works in the 1970s [44]. An additional problem exists the extraction of concentration profiles, cg(x), from Eq. (22) is an inverse problem the intensity as a function of the analysis angle is the Laplace transform of the composition depth profile of the sample [43] and does not have a unique solution. Several algorithms to solve the inversion problem were developed and tested [46]. They are all very unstable and sensitive to small statistical... 

Reproduced with permission fiom Bhaskar, S., AUgeyer, D., Smythe, J.A., 2006. Depth profiling of dielectric SrTiOs thin films by angle-resolved X-ray photoelectron spectroscopy. Appl. Pbys. Lett. 89, 254103/1—254103/3, 2006 American Institute of Physics. 

Cumpson, PJ. Angle-resolved X-ray photoelectron spectroscopy. In Briggs, D., Grant, J.T. (eds.) Surface Analysis by Auger and X-Ray otoelectron Spectroscopy, pp. 651-675. IM PubU-cations and Surface Spectra Limited, Chichester and Manchester, UK (2003)... 

Lockett, V, Sedev, R., Bassell, C. and Ralston, J., Angle-resolved X-ray photoelectron spectroscopy of the surface of imidazolium ionic liquids, Phys. Chem. Chem. Phys. 10,1330-... 

Haasch RT, Patscheider J, Hellgren N, Petrov I, Greene JE (2012) The Si3N4 interface 1. TIN (001) grown and analyzed in situ using angle-resolved x-ray photoelectron spectroscopy. Surf Sci Spectra 19 33... 

ARXPS Angle-resolved X-ray photoelectron spectroscopy cfr. ADXPS)... 

S. Takabayashi, K. Motomitsu, T. TakahagL A. Terayama, K. Okamoto, T. Nakatani, Qualitative analysis of a diamondUke carbon film by angle-resolved X-ray photoelectron spectroscopy. J. Appl. Phys. 101, 103542 (2007)... 

Artyushkova K, Fulghum JE, Reznikov Y. Orientation of 5CB molecules on aligning substrates smdied by angle resolved X-ray photoelectron spectroscopy. Mol Cryst Liq Cryst 2005 438 1769-1777. 

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