American Vacuum Society

M. S. Kaminsky and J. M. Lafferty, Dictionay of Terms for Vacuum Science and Technology, American Vacuum Society, Thorofare, N.J., 1980, pp. 70—71. 

Through its committees, divisions, and chapters, the American Vacuum Society has produced a nearly complete bibhography (to 1996) (8), a dictionary of terms (9), a monograph series, and a number of other useful pubHcations (10). Another source of information is the Association of Vacuum Equipment Manufacturers. A history of vacuum ideas and technology development from the Middle Ages to Newton has been given (11). 

Vacuum systems, largely for the semiconductor industry, are the main source of sales (see Semiconductors). The sales of all vacuum equipment, pumps (qv), valves, sensors (qv), etc, in the United States, including apphcations not in vacuum systems, generally exceed 500 X 10 /yr. A reasonably comprehensive hst of high vacuum manufacturers is supphed by the American Vacuum Society s exhibitor s hst. In Europe, a special issue of the journal A acuum serves similady. 

L. C. Beavis, V. J. Harwood, and M. T. Thomas, Vacuum Edacyards Manual, American Vacuum Society, New York, 1975. 

P. Holloway, Vacuum Took Bibliography, American Vacuum Society, New York, 1982. 

J. L. Vossen, Bibliography on Metallicyation Materials and Techniques for Silicon Devices, Vols. 6 (1980), 7 (1981), and 8 (1982), American Vacuum Society, New York. 

L. L. Levenson, N. MiUeron, and D. H. Davis, Transactions of the American Vacuum Society, Pergamon Press, Inc., Eknsford, N.Y., 1961. 

P. A. Redhead, Vacuum Science and Technology Pioneers of the 20th Century, History of Vacuum Science and Technology, Vol. 2, AIP Press for the American Vacuum Society, New York, 1994. 

Figure 2.5. Potassium (a) and sodium (b) induced work function changes for adsorption at 100 K (open circles) and after annealing to 350 K or upon alkali adsorption at 350 K (open triangles) on Al single crystals.23 Reprinted with permission from the American Vacuum Society.

Figure 2.38. Effect of preadsorbed S on the amount of H2CO and CO formed as a result of CH3OH interaction with Ni(lOO).110 Reprinted with permission from the American Vacuum Society.

This work was supported in part by the Robert A. Welch Foundation and the National Science Foundation (CHE 80-05107). A fellowship to JRC awarded by the New Mexico Section of the American Vacuum Society is gratefully acknowledged. 

Fig. 8.5 A scanning electron micrograph of a silicon dioxide mold with reverse patterns the left and right trenches create a bus and a microring waveguides, respectively. The high aspect ratio protruded wall between trenches is used to stamp out a narrow coupling gap. Reprinted from Ref. 42 with permission. 2008 American Vacuum Society...

Fig. 8.6 Scanning electron micrographs of a polystyrene microring resonator closely coupled to two bus waveguides (Reproduced with permission from Ref. 43 Copyright 2006, IEEE), and its waveguide cross section showing a rectangular polymer core sitting on top of a pedestal structure. Reprinted from Ref. 42 with permission 2008 American Vacuum Society...

Cryopump System operating down to 2,5 K, 1962 Trans. Ninth National Vacuum Symposium, American Vacuum Society, 216-219, The Macmillan Company, New York... 

Lee S-H, Wongsenakhum P, Gonzale L, Gao J, Chan L, Collins J, Ashtiani K, Levy K (2002) Proceedings of American Vacuum Society Topical Conference on Atomic Layer Deposition, Seoul, Korea... 

Treyz, G. V. Weinman, L. Scarmozzino, R. Osgood, R. M., Jr., presented at the 35th National Symposium of the American Vacuum Society, Atlanta, GA, October 1988, paper TC2-ThA7. 

Figure 5. phE (dark line) and PIE measured by a QMS tuned to mass 44 (light line) accompanying the fracture of fused silica rod in three point bend Time t = 0 is chosen to coincide with the onset of phE, which corresponds closely to the onset of fracture. (Reproduced with permission from Langford, S. C. Dickinson, J. T. Jensen, L. C. J. Vac. Sci. Technol. A. in press. Copyright 1989 American Vacuum Society.)... 

Figure 7. EE and PIE accompanying the fracture of sodium trisilicate glass in three point bend. Fracture occurred at time t = 0. Both emissions show evidence of detector saturation at fracture. (Reproduced with permission from Ref. 13. Copyright 1988 American Vacuum Society.)...

Fig. 7.9 A system in a steady-state condition showing the relationship between Q, S, and P. From The Fundamentals of Vacuum Technology, 3rd Edition FIG. 13, by H.G. Tompkins, 1997 by the American Vacuum Society, American Institute of Physics, New York, reproduced (abstracted) with permission...

The following monographs were published by, and are available from, The American Vacuum Society. They were all written by experts in their respective fields and are excellent resource materials. For further information and prices, please contact the American Vacuum Society, 335 E. 45th St., New York, NY 10017. 

Dictionary of Terms for the Areas of Science and Technology Served by the American Vacuum Society, 2nd ed., edited by H.G. Tompkins, 1980 by the American Vacuum Society. Vacuum Hazards Manual, 2nd ed., L.C. Bea-vis, V.J. Harwood, and M.T. Thomas, Coordinated by M.T. Thomas, 1979 by the American Vacuum Society. 

Partial Pressure Analyzers and Analysis, M.J. Drink wine and D. Lichtman, 1984 by the American Vacuum Society. History of Vacuum Science and Technology, a Special Volume Commemorating the 30th Anniversary of the American Vacuum Society, 1953-1983, edited by T.E. Madey and W.C. Brown, 1983. 

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