Aluminum depth profile

NAA cannot be used for some important elements, such as aluminum (in a Si or Si02 matrix) and boron. The radioactivity produced from silicon directly interferes with that ftom aluminum, while boron does not produce any radioisotope following neutron irradiation. (However, an in-beam neutron method known as neutron depth profiling C3J be used to obtain boron depth profiles in thin films. ) Another limitation of NAA is the long turn-around time necessary to complete the experiment. A typical survey measurement of all impurities in a sample may take 2-4 weeks. 

Fig. 40. Auger depth profile of an as-prepared oxide obtained by anodizing 2024 aluminum alloy in phosphoric acid. Reproduced by permission of Chapman and Hall Ltd. from Ref. [38].

The Auger depth profile of an aluminum substrate that was anodized in phosphoric acid and then exposed to 100% relative humidity at 50°C for 73 h is... 

Figure 31 RBS spectra and depth profile for aluminum with implanted antimony.

Fig. 12.59. Depth profile of the concentration of OH for Al and Al alloys (a) Al, (b) Al-Mo, (c) Al-W, (d) Al-Ta. (Reprinted from J. O M. Bockris and J. Kang, The Protectivity of Aluminum and its Alloys with Transition Metals, J. Solid State Electrochem. 1 24,1997, with permission from Springer-Ver-lag.)...

Figure 10.13 Depth profiles focusing on the increase in fluorine concentration at the interface on the O2 plasma treated sample and the decrease in the Si/C ratio at the interface on the panel without the O2 plasma treatment. The aluminum peak area serves as a reference to when the film is removed from each panel and shows that the film thickness and sputtering rates are quite similar. The both samples were prepared by using the contaminated reactor.

The chemical state of aluminum on the surface has a multitude of possible configuration designations. The state in the hydroxylated outer layer corresponds to various mineral phases such as AIO(OH) (boehmite), Al(OH)3, having a modified Auger parameter of 1460.6 on the acetone-cleaned surface and 1461.4 on both the (Aik) and (Dox) surfaces. When capped with a plasma polymer, depth profiles show that the state of the aluminum is seen to be consistent with the many oxides, as well as mixed states with plasma film components. 

Figure 3 Depth profiles of dissolved aluminum in the central North Pacific (28°N 155°W Orians and Bruland, 1986), in the eastern North Atlantic (31°W, 26°N Hydes, 1983), and in the western North Atlantic (near Bermuda, EN120 Station 3 Measures etal., 1986).

Figure 7. Elemental depth profile after one hour plasma treatment of nylon 6/7.5% layered silicate nanocomposites. (1. oxygen, 2. silicon, 3. aluminum, 4.

Fig. 8. AES Depth Profile of the Aluminum Foil Treated by Aqueous Chromium(III) Fumarato-Coordination...

The commercial aluminum-polyethylene composite film was kept in a soxhlet extractor and xylene was used in a 14-hour extraction to remove the polyethylene from the composite film. After removal of the polyethylene film the remaining film was rinsed by ethyl alcohol and dried. The dried film was used in the study of aluminum-polyethylene "free interface by AES depth profile technique. 

Figure 12 gives the results of the AES depth profile of aluminum-polyethylene interface. At five different levels, the Ar sputtering was intervened, and A1 2p binding energy was measured by ESCA. Argon sputtering time, relative atomic concentration of carbon and aluminum at different levels are listed as follows ... 

Showed that carbon in the surface or skin [12] consists of carbide (51%) carbon (41%) and carbonate (8%). Infrared depth profiling by diffuse reflectance infrared spectroscopy (DRIFT) provided further important insights [52], It showed that carbon alters the oxygen environment of the aluminum atoms near the fiber surface from octahedral to tetrahedral coordination and promotes the generation of carbonaceous species such as ethers and esters in addition to carbonates and carbides [52] which have also been found with XPS [12],... 

Figure 34.16. Roughness depth profile of the surface of an aluminum casting without addition of an aerogelic nanoadditive.

In failure analysis the possibility to record all elements is advantageous, not least in combination with 3D imaging (i.e., a TOF-SIMS instrument with dual-beam capability is the instrument of choice). An example is the investigation of black spots in OLEDs where a fluorine-based polymer was sandwiched between a metallic cathode consisting of Ba and A1 and a poly(3,4-ethylenedioxythiophene)/ITO anode. From the recorded raw data, depth profiles can be reconstructed as well as two-dimensional (2D) images in any depth or a 3D representation of all interesting signals. It was found that aluminum was oxidized at the Al/polymer interface [220]. 

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