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Cross-sectional showing transducer integration with integrated electronics.

Cross-sectional shrinkage as a function of carbon yield in the first carbonization. Unidirectional composites fabricated with PAN-based fibers and various matrix precursors.

Cross-sectional shrinkage as a function of heating rate during carbonization of unidirectional composites fabricated with high-modulus PAN-based fibers and pitch matrix under three conditions of pressure and sulfur content .

Cross-sectional shrinkage behaviour during the primary

Cross-sectional sideview of a syimnetric, tliree-layer interferometer illustrating the origin of primary, secondary, tertiary and gap FECOs.

Cross-sectional sideview of a symmetric, three-layer interferometer illustrating the origin of primary, secondary, tertiary and gap FECOs.

Cross-sectional slices for a conventional screw at a letdown ratio of 220

Cross-sectional square tube pitch view.

Cross-sectional STEM bright field images viewed along the direction, microfacets.

Cross-sectional STEM image of cioseiy stacked InAs QD. The second QD was combined with the first QD through the GtiAs nanohole

Cross-sectional STEM images of as-grown InAs QDs , respectively

Cross-sectional STEM images of double-stacked InAs QDs with different second-InAs coverage of 2.5 ML . The first-InAs coverage was 2.5 ML

Cross-sectional STEM images of InAs QDs without capping layer , respectively

Cross-sectional structure of a DepoCyte liposome.

Cross-sectional structure of PMMA B-2 hollow fiber membrane. Reprinted from . Copyright 1992, with kind permission from the Society of Polymer Science, Japan

Cross-sectional structureof CA reverse osmosis membrane. Reprinted from , Copyright 1992, with kind permission from the Society of Polymer Science, Japan

Cross-sectional surface of TEM images and the electron beam diffraction patterns of crystal lattice in ZrO Ny prepared at 50, 500 and 700 C .

Cross-sectional sutFace of a young quaking aspen stem. Note the white arcs tension wood

Cross-sectional TEM image of

Cross-sectional TEM image of a 10-rnn Co film deposited onto a 30-nm Alqa film. Taken Irom with permission

Cross-sectional TEM image of a 700 nm PS-b-PMMA film annealed under 40 V pm electric field for 16 h. Scale bar

Cross-sectional TEM image of a thin A1 film epitaxially deposited on a single crystal a-Al203 substrate. A threading dislocation, indicated by the horizontal arrow, leaves behind a misfit dislocation segment at some distance from the interface. This misfit dislocation segment was found to interact with dislocations formed previously at the film substrate interface. Reproduced with permission from Dehm et al. .

Cross-sectional TEM image of azimuthally oriented diamond crystal on Ni. The presence of the interfacial layer, Ni4C, is apparent .

Cross-sectional TEM image of electrochemically formed carbon film on stainless steel

Cross-sectional TEM image of magnetic layer for rigid disk . 1.2 Tape drive systems



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