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Cross-sectional SEM micrograph of .

Cross-sectional SEM micrograph of a Bai. Sr TiOs film showing step coverage using Ba

Cross-sectional SEM micrograph of a crack-free yet porous hydroxyapatite coating deposited on a 316L stainless steel substrate by flame-assisted chemical vapour

Cross-sectional SEM micrograph of MS-SOFC developed by NRC . Reproduced here with kind permission from i Elsevier 2008

Cross-sectional SEM micrograph of MS-SOFC fabricated by Ceres

Cross-sectional SEM micrograph of PMo-PSF-DMF .

Cross-sectional SEM micrograph of SCS-6 fibre

Cross-sectional SEM micrographs

Cross-sectional SEM micrographs of , but baked at 170 C for 60 seconds. The resist was exposed on the ISI ArF laser lithographic exposure tool with NA 0.6, partial coherence 0.7, using a half-tone mask, with -i-40-nm mask bias. Processing condition

Cross-sectional SEM micrographs of a thrcc-laycr ceramic membrane Courtesy of US Filters

Cross-sectional SEM micrographs of MS-SOFC fabricated by suspension plasma spraying at the NRC

Cross-sectional SEM micrographs of multilayer BT ST bulk sample, high magnifinatifin is showing the grains structure of dense BT layers.

Cross-sectional SEM micrographs of non-planner laminates with 3-fibre electrodes. Each electrode has 37 layers, is a high magnification micrograph showing the details of layers microstructure.

Cross-sectional SEM micrographs of non-planner laminates. Sequentionally deposited from BT-ST ethanol suspensions of composition 100, 75, 50 and 25 v o of BT. is a high magnification micrograph showing the details of layers microstructure.

Cross-sectional SEM micrographs of the anodes after lengthy testing, .

Cross-sectional SEM micrographs showing metallic pillars of 3-pm-thick Al-0.5 Cu preserved under the anodization mask of barrier AI2O3. Porous-type anodization voltage is 20 V. Reproduced from Ref.32 with permission from

Cross-sectional SEM micrographs showing multiple pillars of the 9.5-pm-thick Al-0.5 Cu. Porous-type anodization time is 80 min. Pitch is 15 pm . Reproduced from Ref.47 with permission from ECS — The Electrochemical Society.

Cross-sectional SEM micrographs showing pillars of 9.5- lm-thick Al-0.5 Cu obtained after localized porous-type anodization and chemical etching of porous AI2O3.

Cross-sectional SEM of a P2T-NF-PZT multilayer annealed at 65 y C. NF-PZT layered structure.

Cross-sectional SEM of cuticular membrane isolated from tomato fruit.

Cross-sectional SEM of membrane electrode assembly, microporous layer, and paper-based macro diffusion media.

Cross-sectional SEM of porous silicon prepared from n-type

Cross-sectional SEM photos of three-dimensional fluidic channels and electric conductors

Cross-sectional SEM pictures of the honeycomb CMSM

Cross-sectional shapes of pits . Reprinted, with permission, from ASTM G 46-94, Standard Guide for Examination and Evaluation of Pitting Corrosion, copyright ASTM International, West Conshohocken, PA.



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