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Cross-sectional SEM image of porous n-type InP after porous-etching at - -5 V during 1 min, in 1 M HCl .

Cross-sectional SEM image of porous Si formed by porous photoetching on .

Cross-sectional SEM image of SUS304 after nitriding at 315 C

Cross-sectional SEM image of the porous 6H-SiC. The sample was tilted to allow simultaneous viewing of the porous network in cross-section along with the pores on the top surface. Pore formation starts at the surface and then it develops into an inverted V-shaped branched structure in the bulk. Reproduced from A. Sagar et al.,. Appl. Pbys. 92, 4070. Copyright , with permission from the American Institute of Physics

Cross-sectional SEM image of the PS sample after the 10 min nickel electrodeposition.

Cross-sectional SEM images and 45 bevel of n-type Si samples hexagonal

Cross-sectional SEM images of 110-nm, 160-nm, and 200-nm contact holes patterned into SI02 substrate with an acrylate resist. Pitch 300 nm. The resist has been stripped.

Cross-sectional SEM images of 115-nm contact holes resultingfrom electron-beam-induced CD shrink. Electron-beam irradiation parameters

Cross-sectional SEM images of 160-nm trench patterned into Si02 substrate with an acrylate resist.

Cross-sectional SEM images of an a-silicon thin-film electrode in the

Cross-sectional SEM images of an A1PO film deposited on Si02 and cured at flash annealed to 600 C. Reproduced with permission. Meyers, S. T. Anderson, J. T. Hong, D. Hung, C. M. Wager, J. F. Keszler, D. A. 2007. Solution processed aluminum oxide phosphate thin-film dielectrics. Chem. Mater. 19

Cross-sectional SEM images of as-sprayed hydroxyapatite coatings .

Cross-sectional SEM images of BMI and Kapton coated with Ti02 a BMI, Method 1, 7 h coating time .

Cross-sectional SEM images of final coating microstructures prepared under slow and fast rates of external gas-phase mass transfer conditions. Adapted, by permission, Mahendraet al., Proceedings of 9th International Coating Science and Technology Symposium, Delaware, USA, May 17 - 20, 1998, pp. 177 - 180 .

Cross-sectional SEM images of LSM-SDC cathodes containing different amounts of ethyl cellulose

Cross-sectional SEM images of macroporous Si formed on Na 10 cm in 10 HF dimethylsulfoxide

Cross-sectional SEM images of p-type Cdo.95Zno.05Te after porous-etching .

Cross-sectional SEM images of porous 4H-SiC, hydrogen etched at 1680 C for , with permission from American Institute of Physics

Cross-sectional SEM images of some typical multilayer structures

Cross-sectional SEM images of tapered Ti02 nanotubes obtained by using a time-varying anodization voltage, d and D denote the diameter of apex and cone base, respectively, Nanotubes obtained by initial anodization at 10 V for 20 min, followed by the linearly increasing voltage at a rate of 1.0 V min up to 23 V, and finally a constant voltage at 23 V for 2 min ,

Cross-sectional SEM images of templated nickel films, a Partially refilled template, b Freestanding nickel array imaged after template removal revealing a strut diameter of 11.0 0.3 nm

Cross-sectional SEM images of templated V2O5 electrodes highlighting the differences in structural dimensions, a Mesoporous DG-structured deposit, b Macroporous lO stmcture. Note the different scale bars

Cross-sectional SEM images of the PLZT ceramics derived from the milled oxide mixture sintered for 4 h at different temperatures

Cross-sectional SEM images of vacuum-plasma sprayed .

Cross-sectional SEM images of Zn2Sn04 fibers of SEM image of unpressed Ti02 nanofibers after calcination at



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