X-ray diffraction topography

Phakey, P. P. (1967). Defects in quartz studied by transmission electron microscopy and x-ray diffraction topography. PhD. thesis. Monash University, Clayton, Victoria, Australia. 

Specimens were extracted from the deformed samples at different radii from the cylinder axis, along the torsion axis direction. Some of the diffraction analyses were performed using a hard X-ray diffraction technique developped at Institut Laue Langevin, others were observed via synchrotron X-ray diffraction topography at ESRF (European Synchrotron Radiation Facilities) on the "ID19" beamline. 

Polcarova, M. (1969). Application of X-ray diffraction topography to the study of magnetic domains. IEEE Transactions on Magnetics, MAG-5, 536-44. 

One much-used method of X-ray diffraction topography is the Berg-Barrett method, where the crystal is set to reflect X-rays at the Bragg angle for some plane. Geometric resolutions of about 1 pm can be achieved, and single dislocations can be resolved. The eontrast on the film is due to variations in the reflecting power due to imperfeetions in the crystal. 

Mavromoustakos, T., Yang, D. P., Charalambous, A., Herbette, L. G. and Makriyannis, A. (1990). Study of the topography of cannabinoids in model membranes using X-ray diffraction, Biochim. Biophys. Acta, 1024, 336-344. 

This Datareview describes the techniques of X-ray diffraction, reflectivity and topography as applied to group III nitrides. The various types of information on microstructure are described as are the more common mistakes made in interpretation of this information. More comprehensive studies are proposed to extract further information... 

Microstructure determination of group III nitrides using X-ray diffraction, reflectivity and topography has been discussed. A logical sequence from simple to more advanced studies is described, as are the pitfalls encountered in data interpretation. Further studies on more advanced measurements and... 

Topography of the samples was investigated with atomic force microscope Solver P47 in semicontact and contact modes. Optical properties were analyzed with the spectrophotometer Hitachi U-3010 (0.2 - 1.1 microns) with integrated sphere and monochromator MDR-3 (0.5 - 1.8 microns) with automatic system of signal registration. Spectra of x-ray diffraction have been recorded with the help of x-ray diffractometer Bruker D8 Advance. 

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