X-Ray Diffraction and EELS

The previous chapters have already illustrated that X-ray diffraction suits very well to analyze crystalline samples. It allows for determining not only the type of lattice, but also the particle size of the crystaUine phase. Moreover, the presence of further crystalline or amorphous modifications and of impurities can be detected. The latter two cases become apparent in additional signals or in the existence of a background spectrum. 

From the data obtained, a lattice constant of 0.3562 run has been determined, which is a little less than in the bulk phase (0.3567run). With the method of 

Selyakov and Scherrer, an average particle size of 4.5 0.5 nm can be determined from the half width of the diffraction signals. This figure is in good accordance with the particle diameters derived from electron microscopy. 

The carbon s phase purity may be checked as well by way of X-ray diffraction. 

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