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Transmission microscopy, single crystal substrates

For single crystal substrates which are not in the form of thin films, the techniques of transmission microscopy and nanodiffraction can not be used. For such cases, the techniques of reflection electron microscopy (REM) or its scanning variant (SREM) and reflection high energy electron diffraction (RHEED), in the selected area or convergent beam modes, may be applied (18). [Pg.352]

See other pages where Transmission microscopy, single crystal substrates is mentioned: [Pg.203]    [Pg.33]    [Pg.285]    [Pg.386]    [Pg.277]    [Pg.306]    [Pg.297]    [Pg.394]    [Pg.408]    [Pg.145]    [Pg.277]    [Pg.1112]    [Pg.92]    [Pg.96]    [Pg.373]    [Pg.78]   
See also in sourсe #XX -- [ Pg.359 ]



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