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Transmission electron microscopy. See

Historically, carbon nanotubes were first observed by Transmission Electron Microscopy, see Figure 3.5 (2). Then, nanotubes have gained interest worldwide and led to an incredible number of published papers. It is simply not possible to give an exhaustive list of all studies involving TEM. However, a few ones can be highlighted because they focused on the characterisation of the nanotube intrinsic properties, which in turn will play a great role on the polymer/ composite properties. [Pg.56]

It is obvious from Fig. 12 that crack formation does not start at emergent imperfections which has been confirmed by transmission electron microscopy (see Sect. IV.b.)59. The scanning electron micrographs of poly-DSP and poly-P2VB44) crystals are quite different. The difference may be reflected by a crystal volume change during polymerization in which the DSP crystals shrink while the P2VB crystals expand. [Pg.36]

STEM Scanning transmission electron microscopy. See Electron Microscopy. [Pg.763]

PMDA-ODA) polyimide when the metal was deposited at elevated temperatures and low deposition rates. The formation of Cu and Ag clusters in the bulk of polyimides has also been shown by means of cross-sectional transmission electron microscopy (see below). [Pg.80]

As this preparation method allow the deposition of higher loading of Mo as well dispersed oxomolybdate entities, it would be interesting to compare the morphology of the disulfide crystallites with those obtained on conventionally prepared systems. Therefore some of these samples have been observed by transmission electron microscopy (see typical micrograph in fig. 5). [Pg.1045]

Figures 1 and 2 illustrate two key signatures of wholly microporous silicon the absence of any mesopores (>2 nm width) by high-resolution transmission electron microscopy (see handbook chapter Microscopy of Porous Silicon ) and the absence of any hysteresis in a type I isotherm of nitrogen adsorption and desorption in a material of very high surface area (see handbook chapter Gas Adsorption Analysis of Porous Silicon ). Figures 1 and 2 illustrate two key signatures of wholly microporous silicon the absence of any mesopores (>2 nm width) by high-resolution transmission electron microscopy (see handbook chapter Microscopy of Porous Silicon ) and the absence of any hysteresis in a type I isotherm of nitrogen adsorption and desorption in a material of very high surface area (see handbook chapter Gas Adsorption Analysis of Porous Silicon ).
STEM (scanning transmission electron microscopy) (see also TEM ) 147 surface area... [Pg.327]


See other pages where Transmission electron microscopy. See is mentioned: [Pg.139]    [Pg.25]    [Pg.791]    [Pg.31]    [Pg.67]    [Pg.292]    [Pg.531]    [Pg.124]    [Pg.179]    [Pg.334]    [Pg.918]    [Pg.143]    [Pg.424]   


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Transmission electron microscopy

Transmission electronic microscopy

Transmission microscopy

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