Transmission electron micrographs, titanium

Figure C2.17.6. Transmission electron micrograph and its Fourier transfonn for a TiC nanocrystal. High-resolution images of nanocrystals can be used to identify crystal stmctures. In tliis case, tire image of a nanocrystal of titanium carbide (right) was Fourier transfonned to produce tire pattern on tire left. From an analysis of tire spot geometry and spacing, one can detennine that tire nanocrystal is oriented witli its 11001 zone axis parallel to tire viewing direction [217].

Figure 10.4. Transmission electron micrograph of a silica/alumina-treated grade of titanium dioxide. The surface coating designed to improve durability appears as a shadow around the perimeter of the crystal (300,000x magnification).

Figure 6-1. Transmission electron micrographs of (a) titanium-isopropoxide derived powder, Ti02 I and (b) titanium-ethoxide derived powder, Ti02 II (Reproduced with permission from Barringer and Bowen (1982) J Amer Ceram Soc C-199-C-203, Copyright 1982 American Ceramic Society).

Fig. 7 High-resolution transmission electron microscopy. HRTEM micrograph of lamellar y/ot2 titanium aluminide. From top to bottom, first twin variant of tetragonal y-TiAl, hexagonal 2-Ti3Al, second twin variant of y-TiAl and again ot2-Ti3Al. Incident beam direction for the tetragonal phases is 1 1 0, for the hexagonal phase 1 1 0. (View this art in color at www.dekker.com.)...

Optical (a), scanning (b), and transmission (c) electron micrographs of rutile titanium dioxide pigment show the differences in information that can be obtained with the three modes of microscopy. 

Figure 5.14. Transmission electron microscopy micrographs of p)olyester fiber cross sections reveal the size of the pigment particles. The optical inset (A) shows fibers with dense particles in greater amounts than seen by TEM due to the difference in section thickness. The dense particle aggregates are titanium dioxide particles. The fiber exhibits no major structural detail. The dense lines are knife marks produced during...

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