Transmission electron aberration-corrected microscope

The point resolution of an electron microscope is limited by the spherical aberration of the objective lens. Haider et al. (1995 1998) developed a corrector to be implemented into a standard transmission electron microscope to correct the spherical aberration. They showed that the point resolution could be improved from 2.4 A to 1.4 A. 

Urban K, Kabius B, Haider M, Rose H (1999) A way to higher resolution spherical aberration correction in a 200kV transmission electron microscope. J Electron Microsc 48 821-826 Veblen DR, Ferry JM (1983) A TEM study of the biotite-chlorite reaction and comparison with petrologic observations. Am Mineral 68 1160-1168... 

Haider M, Rose H, Uhlemann S, Schwab E, Kabius B and Urban K 1998 A spherical-aberration-corrected 200 keV transmission electron microscope Ultramicroscopy 75 53-60... 

A. A. Herzing et al. Energy dispersive X-ray spectroscopy of bimetallic nanoparticles in an aberration corrected scanning transmission electron microscope, Faraday Discuss., 2008, 138(0), 337-351. 

FIGURE 17 Correction of spherical aberration in a scanning transmission electron microscope. (Left) Schematic diagram of the quadrupole-octopole corrector and typical trajectories. (Right) Incorporation of the corrector in the column of a Vacuum Generators STEM. [From Krivanek, O. L., et al. (1997). Institute of Physics Conference Series 153, 35. Copyright lOP Publishing.]... 

FIGURE 18 Correction of spherical aberration in a transmission electron microscope. Arrangemnent of round lenses and sex-tupoies (hexapoies) that forms a semiaplanatic objective lens. The distances are chosen to eliminate radial coma. [From Flaider, M., et al. (1995). Optik 99, 167. Copyright Wissenschaftliche Verlagsgesellschaft.]... 

FIGURE 19 (a) The corrector of Fig. 18 incorporated in a transmission electron microscope, (b) The phase contrast transfer function of the corrected microscope. Dashed line no correction. Full line corrector switched on, energy width (a measure of the temporal coherence) 0.7 eV. Dotted line energy width 0.2 eV. Chromatic aberration remains a problem, and the full benefit of the corrector is obtained only if the energy width is very narrow. [From Haider, M., et al. (1998). J. Electron Microsc. 47,395. Copyright Japanese Society of Electron Microscopy.]... 

Wen J et al (2010) The formation and utility of sub-angstrom to nanometer-sized electron probes in the aberration-corrected transmission electron microscope at the University of Illinois. Microsc Microanal 16 183. doi 10.1017/S1431927610000085... 

This chapter outlines how the recent advancements in transmission electron microscope instrumentation have provided new opportunities for high resolution characterisation of inorganic nanoparticle systems. Concentrating on the smallest nanoclusters, nanocrystals and nanoparticles with diameters of 1-50 nm we outline how the development of aberration correcting lenses,brighter, more coherent electron sources, and smarter, more efficient detector systems, has improved electron microscopy imaging and analysis at the nanoscale. 

After decades of work and anticipation, systems that correct for aberrations of the electromagnetic lenses used in electron microscopy have now been developed [44-46]. The resolution of the standard transmission electron microscope (TEM) was described in Section 3.1.4.3, and the spherical aberration coefficient (Cs) appears in... 

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