Thermal microscopy birefringence

Microscopy. The polarized optical micrographs of thin films of HX-205 and F-185 neat resins were obtained using a Zeiss ultraphot microscope equipped with a polarizer and an analyzer. Thin films, approximately 100 microns thick, were prepared by thln-sectlonlng the resin sheet with a razor blade at room temperature. The domains were observable because of light scattering as a result of refractive Index mismatch between the rubber domain and the epoxy matrix, as well as to stress-induced birefringence produced by the thermal stress Imposed on the domains. 

The various phase transitions can be revealed by polarized light microscopy which shows changes in the birefringence pattern (texture), by thermal analysis which shows changes in enthalpy or volume, and by X-ray diffraction which shows changes in the local arrangement of atoms. The structural assessment is... 

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