Synchrotron orbital radiation analysis

The study of the photoionization cross section as a function of photon energy for the different orbitals of Me4Sn, which can be a powerful tool for the assignment of the spectra and the analysis of the contribution of the various atomic orbitals to the molecular orbitals, has been carried out by the authors of References 11 and 12 by using He I and He II as ionizing source, and of Reference 13 by using synchrotron radiation. Bertoncello... 

IR, Raman, NMR, ESR, UPS, XPS, AES, EELS, SIMS) [1]. However, some industrial carbon materials such as amorphous carbon films and carbon black cannot be easily characterized from the local-structure point of view by these methods, because these materials usually take amorphous and complex structures. Recently, soft X-ray emission and absorption spectroscopy using highly brilliant synchrotron radiation [2] has been utilized to characterize various carbon materials, because information on both the occupied and unoccupied orbitals, which directly reflect the local structure and chemical states, can be provided from the high-resolution soft X-ray measurements. We have applied the soft X-ray spectroscopy to elucidate the local structure and chemical states of various carbon materials [3]. Additionally, we have successfully used the discrete variational (DV)-Xa method [4] for the soft X-ray spectroscopic analysis of the carbon materials, because the DV-Xa method can easily treat complex carbon cluster models, which should be considered for the structural analysis of amorphous carbon materials. 

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