Surface films, analysis

Feldman L C and Mayer J W 1986 Fundamentals of Surface and Thin Film Analysis (Amsterdam Elsevier)... 

Photoelectrochemistry may be used as an in situ teclmique for the characterization of surface films fonned on metal electrodes during corrosion. Analysis of the spectra allows the identification of semiconductor surface phases and the characterization of their thickness and electronic properties. 

Surface and Thin Film Analysis Principles, Instrumentation, Applications 11... 

Compared with the other methods of surface and thin film analysis, the main advantages of SNMS are ... 

Strained set of lattice parameters and calculating the stress from the peak shifts, taking into account the angle of the detected sets of planes relative to the surface (see discussion above). If the assumed unstrained lattice parameters are incorrect not all peaks will give the same values. It should be borne in mind that, because of stoichiometry or impurity effects, modified surface films often have unstrained lattice parameters that are different from the same materials in the bulk form. In addition, thin film mechanical properties (Young s modulus and Poisson ratio) can differ from those of bulk materials. Where pronounced texture and stress are present simultaneously analysis can be particularly difficult. 

Jacobson, Anal. Chem. 69 (1997) 3747-3753. 3-120 L. C. Peldman, J. W. Mayer Fundamentals of Surface and Thin Film Analysis, North Holland, New York 1986. 

Therefore, this book is to give the analyst - whether a newcomer wishing to acquaint themself with new methods or a materials analyst needing to inform themself on methods that are not available in their own laboratory - a clue about the principles, instrumentation, and applications of the methods, techniques, and procedures of surface and thin-film analysis. The first step into this direction was the chapter Surface and Thin Film Analysis of Ullmann s Encyclopedia of Industrial Chemistry (Vol. B6, Wiley-VCH, Weinheim 2002) in which practitioners give briefly outline the methods. 

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