Summary Sample Preparation for Surface Spectroscopy

Sample Preparation/Treatment Options for In Situ Reaction Studies 

The author acknowledges funding from the National Science Foundation, Ohio Board of Regents, AFRL, and National Aeronautics and Space Administration, for financial support. Special thanks go to two of her students, N. Mahadev and P. Joshi, for help with the figures and tables. 

Brundle, C. A. Evans, Jr., S. Wilson, and L. E. Fitzpatrick, eds., Encyclopedia of Materials Characterization Surfaces, Interfaces, Thin Films, Butterworth-Heinemann, Woburn, MA, 1992. 

Fieldman and J. W. Mayer, Fundamentals of Surface and Thin Film Analysis, Prentice Hall, Englewood Cliff, NJ, 1986. 

Wacthman, Characterization of Materials, Butterworth-Heinemann, Woburn, MA, 1985. 

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