Subject morphology, role

The surface morphology of grains has been studied by secondary electron microscopy (SEM) (Hoppe et al., 1995). Such studies have been especially useful for pristine SiC grains that have not been subjected to any chemical treatment (Bernatowicz et al., 2003). Finally, the transmission electron microscope (TEM) played an important role in the discovery of presolar SiC (Bernatowicz et al., 1987) and internal TiC and other subgrains in graphite (Bernatowicz et al., 1991). It has also been successfully applied to the study of diamonds (Daulton et al., 1996) and of polytypes of SiC (Daulton et al., 2002, 2003). 

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