Structural characterization of the material

All of these parameters can influence the electric properties of the films. 

The first method consists of using an X-ray diffraction peak of the materiaf. In effect, this peak is representative of the crystallographic field of a Sn02 grain. 

The size L of the coherent fields can be calculated from the diffraction peak width halfway up, using the Scherrer formula  

In practice, L is calculated for the most intense diffraction rays, and the calculated value is an average. 

In the case of thin films whose thickness is not greater than 300 A, it is difficult to obtain the X-ray diffraction spectra. 

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I wish to thank my friends and collaborators. Dr. Chris Martin (University of Manchester, UK) and Mr. Robert Olley (University of Reading, UK) for extremely helpful assistance in the structural characterization of the materials. I always enjoyed scientific discussions and work with them and wish them all the best for their career and future. 1 consider myself lucky I had the chance to meet Robert and work with him over the last decade. 1 thank him for sharing with me his exceptional knowledge in the field of investigation of polyurethane morphology. I thank him for teaching me the in and outs of electron microscopy. 

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