SRPES synchrotron radiation photoelectron

SRPES synchrotron radiation photoelectron spectroscopy. For photon energies less than 300 eV also SXPS soft X-ray photoelectron spectroscopy. 

Accurate investigation of the valence ionization spectra is important subject to elucidate the electronic structure of molecules. Ionization spectra of five-membered aromatic compounds have also been intensively studied. The high-resolution synchrotron radiation photoelectron spectra (SRPES) of furan and thiophene were measured and analyzed with asymmetry parameter up to about 40 eV [63,64]. The electron momentum spectroscopy (EMS) was also applied to furan up to 30-40 eV [65]. The ionization spectra of these molecules were also studied by several theoretical methods. However, there were some controversial assignments even for the outer-valence region, in particular for the peak position of Ibi(TTi) state and the inner-valence spectra have not been theoretically reproduced. 

Among the related methods, specific experimental designs for applications are emphasized. As in-system synchrotron radiation photoelectron spectroscopy (SRPES) will be applied below for chemical analysis of electrochemically conditioned surfaces, this method will be presented first, followed by high-resolution electron energy loss spectroscopy (HREELS), photoelectron emission microscopy (PEEM), and X-ray emission spectroscopy (XES). The latter three methods are rather briefly presented due to the more singular results, discussed in Sections 2.4-2.6, that have been obtained with them. Although ultraviolet photoelectron spectroscopy (UPS) is an important method to determine band bendings and surface dipoles of semiconductors, the reader is referred to a rather recent article where all basic features of the method have been elaborated for the analysis of semiconductors [150]. 

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