SPM AFM and STM -Based Techniques

Atomic Force Microscopy (AFM) is capable of routinely providing topographical maps to a spatial resolution of a few nanometers. Samples may be conductors, semiconductors, or insulators. Information is derived by scanning an atomically 

Magnetic Eorce Microscopy (MFM) is similar to EFM except for the fact that magnetic domains are mapped by the tip as opposed to electrostatic domains. This can be done to a spatial resolution of a couple of nanometers. 

Conductive Atomic Force Microscopy (CAFM) also known as CSAFM is capable of providing maps of the electrical conductivity (dl/dV) to a spatial resolution of a couple of nanometers. The sample may be a conductor or semiconductor. Information is derived by measuring the current (100 pA-100 pA) passing to/from the atomically sharp tip and the sample surface of interest. Measurement of I versus F or I versus V curves allows for localized data to be extracted. 

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