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SPM AFM and STM -Based Techniques

Atomic Force Microscopy (AFM) is capable of routinely providing topographical maps to a spatial resolution of a few nanometers. Samples may be conductors, semiconductors, or insulators. Information is derived by scanning an atomically [Pg.329]

Magnetic Eorce Microscopy (MFM) is similar to EFM except for the fact that magnetic domains are mapped by the tip as opposed to electrostatic domains. This can be done to a spatial resolution of a couple of nanometers. [Pg.330]

Conductive Atomic Force Microscopy (CAFM) also known as CSAFM is capable of providing maps of the electrical conductivity (dl/dV) to a spatial resolution of a couple of nanometers. The sample may be a conductor or semiconductor. Information is derived by measuring the current (100 pA-100 pA) passing to/from the atomically sharp tip and the sample surface of interest. Measurement of I versus F or I versus V curves allows for localized data to be extracted. [Pg.330]


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SPM-based techniques

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STM and AFM

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