Specular-reflectance Fourier-transform spectroscopy

Specular reflection Fourier transform infrared spectroscopy, performed with the beam striking the sample at 45- from the surface normal, was also used for in situ studies of the catalytic reaction. This technique makes it possible to observe changes in the gasphase composition [4-5]. The broad band reflectivity of the overlayer can be used to obtain the composition of a thin oxide film [6], Infrared spectra have been obtained from polycrystalline samples and from Cu(llO). The former samples are akin to the ones used for mass spectrometric studies. Distinguished from those studies our FTIR work was performed with a reaction vessel at room temperature. The sample was in this case resistively heated by tantalum wires. This combination separates the gas temperature from the temperature of the catalyst. The temperature of the impinging molecules is a... 

Diffuse reflectance infrared Fourier transform spectroscopy (DRIFTS) is used to obtain spectra of powders and rough polymeric surfaces such as textiles and paper. IR radiation is focused onto the surface of the sample in a cup resulting in both specular reflectance (which directly reflects off the surface having equal angles of incidence and reflectance) and diffuse reflectance (which penetrates into the sample subsequently scattering in all angles). Special mirrors allow the specular reflectance to be minimized. 

Diffuse Reflectance Infrared Fourier Transform Spectroscopy (DRIFT).6 When IR radiation is directed onto the surface of a solid sample, two types of energy reflectance can occur specular and diffuse. The specular component is the radiation that reflects directly off the sample surface (i.e., not absorbed by the sample). Diffuse reflectance is the radiation that penetrates into the sample and then emerges. Diffuse reflectance accessories are designed to optimize the diffuse reflected energy and suppress the specular component. The optics therefore selectively directs the scattered radiation to the IR detector. 

IR spectroscopy is one of the few analytical techniques that can be used for the characterization of solid, liquid, and gas samples. The choice of sampling technique depends upon the goal of the analysis, qualitative identification or quantitative measurement of specific analytes, upon the sample size available, and upon sample composition. Water content of the sample is a major concern, since the most common IR-transparent materials are soluble in water. Samples in different phases must be treated differently. Sampling techniques are available for transmission (absorption) measurements and, since the advent of FTIR, for several types of reflectance (reflection) measurements. The common reflectance measurements are attenuated total reflectance (ATR), diffuse reflectance or diffuse reflectance infrared Fourier transform spectroscopy (DRIFTS), and specular reflectance. The term reflection may be used in place of reflectance and may be more accurate specular reflection is actually what occurs in that measurement, for example. However, the term reflectance is widely used in the literature and will be used here. 

Infrared spectroscopy, including Fourier-transform infrared (FTIR) spectroscopy, is one of the oldest techniques used for surface analysis. ATR has been used for many years to probe the surface composition of polymers that have been surface-modified by an etching process or by deposition of a film. RAIR has been widely used to characterize thin films on the surfaces of specular reflecting substrates. FTIR has numerous characteristics that make it an appropriate technique for... 

Fourier transform infrared spectroscopy (FT-IR) is useful for identifying organic and inorganic compounds by comparison with library references. Perkin Elmer System 2000 offers near IR, mid IR, far IR 15,000-15,030 cm, transmittance (T), specular reflectance (SR Ref. 6) and diffuse reflectance (DR), horizontal and vertical attenuated total reflectance (ATR) microscope (>10-gm spot, 10,000-10,580 cmy ... 

With the advent of the commercial FT-IR instruments, and computer techniques, it is now possible to record the infrared spectrum of almost any material regardless of its shape or form. A number of different sampling accessories are available for recording the infrared spectra. Some of these accessories such as AIR and specular reflectance have been used successfully with dispersive instruments, but the FT-IR instruments allow these accessories to be used more rapidly and with greater sensitivity. Most of the sample handling techniques have been reviewed in detail in the series of volumes on "Fourier Transform Infrared Spectroscopy" edited by J.R. Ferraro and J.R. Basile (1). In this paper, some of these techniques will be reviewed with particular emphasis on reflectance techniques (ATR and diffuse) and photoacoustic spectroscopy. Further applications such as far-IR, diamond cell, the absorption subtraction methodology can be found in the article by Krishnan and Ferraro (2). 

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