Spectra, Profiling, and Imaging Mode

As surface organic contamination generally covers any targeted trace elements in a sample, the use of a sputter gun (i.e., dynamic mode) is useful for a better detection and counting statistics for trace elements. In contrast, organic compounds are effectively destroyed by dynamic SIMS, such that no diagnostic information is obtained. 

Under typical static operating conditions, the results of ToF-SIMS analyses include  

Depth profiles are produced by removal of the surface layers by sputtering under the ion beam. 

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