Spark source mass oxides

Carbide cluster ions (MC + - M = matrix element) have been measured by investigating them directly from the solid carbides (B4C,46 SiC) or by analyzing metal oxide/graphite mixtures (for M = rare earth element,3 Si,46 Th or U36). Figure 9.60 shows the distribution of silicon carbide cluster ions (SiC +) in laser ionization mass spectrometry by the direct analysis of compact SiC in comparison to the carbide cluster ion distribution of LaC + and SrC + in spark source mass spectrometry, by investigating a metal oxide/graphite mixture. 

Finally, the black-brown americium oxide is sieved through a 170 mesh 7.6 cm screen on a mechanical shaker. A complete analysis is done to determine whether the Am02 meets the required product specifications. The analysis of representative batches of americium oxide produced at LASL is shown in Table II. Radiochemistry, emission spectroscopy, calorimetry, and spark source mass spectrometry are used in the analysis of the Am02. Providing the Am02 meets all of the product specifications, it is prepared for shipment. Product not meeting these specifications is recycled through the process at the proper entry point. 

Like ICP mass spectra, spark source mass spectra are much simpler than atotnic emission spectra, consisting of one major peak for each isotope of an element as well as a few weaker lines corresponding to multiply charged inns and ionized oxide and hydroxide species. The presence of these additional ions creates the potential for interference just as in ICPMS. 

Fig.. 7C.l, Spark source mass spectrometrie re.sponse to rare earth content in. "tn oxide-graphite pelleted sample. 

---