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SNMS, analytical method Applications

The application of SIMS, SNMS, SSMS and GDMS in quantitative trace analysis for conducting bulk material is restricted to matrices where standard reference materials (SRMs) are available. For quantification purposes, the well characterized multi-element SRMs (e.g., from NIST) are useful. In Table 9.5 the results of the analysis by SNMS and the RSCs (relative sensitivity coefficients) for different elements in a low alloy steel standard (NBS 467) are compared with those of SSMS. Both solid-state mass spectrometric techniques with high vacuum ion sources allow the determination of light non-metals such as C, N, and P in steel, and the RSCs for the elements measured vary from 0.5 to 3 (except C). RSCs are applied as a correction factor in the analytical method used to obtain... [Pg.261]

The SIMS analytical ion signal of a specific element or isotope also can be enhanced by selective ionization of particular atoms, and the detection limit for that element thereby improved. This mode of SNMS is important to specific applications, but it lacks the generality inherent in nonselective SNMS methods. The focus of this article will be on the methods for obtaining complete, accurate, and matrix-independent compositions of chemically complex thin-film structures and materials. [Pg.573]

Different analytical procedures have been developed for direct atomic spectrometry of solids applicable to inorganic and organic materials in the form of powders, granulate, fibres, foils or sheets. For sample introduction without prior dissolution, a sample can also be suspended in a suitable solvent. Slurry techniques have not been used in relation to polymer/additive analysis. The required amount of sample taken for analysis typically ranges from 0.1 to 10 mg for analyte concentrations in the ppm and ppb range. In direct solid sampling method development, the mass of sample to be used is determined by the sensitivity of the available analytical lines. Physical methods are direct and relative instrumental methods, subjected to matrix-dependent physical and nonspectral interferences. Standard reference samples may be used to compensate for systematic errors. The minimum difficulties cause INAA, SNMS, XRF (for thin samples), TXRF and PIXE. [Pg.626]


See other pages where SNMS, analytical method Applications is mentioned: [Pg.256]    [Pg.256]    [Pg.5]    [Pg.5]    [Pg.440]   
See also in sourсe #XX -- [ Pg.441 ]




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SNMS, analytical method

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