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Silicon hexaboride

XPS spectra were obtained using a Perkin-Elmer Physical Electronics (PHI) 555 electron spectrometer equipped with a double pass cylindrical mirror analyzer (CMA) and 04-500 dual anode x-ray source. The x-ray source used a combination magnesium-silicon anode, with collimation by a shotgun-type collimator (1.). AES/SAM spectra and photomicrographs were obtained with a Perkin-Elmer PHI 610 Scanning Auger Microprobe, which uses a single pass CMA with coaxial lanthanum hexaboride (LaBe) electron gun. [Pg.38]


See other pages where Silicon hexaboride is mentioned: [Pg.889]    [Pg.218]    [Pg.218]    [Pg.889]    [Pg.454]    [Pg.455]    [Pg.454]    [Pg.455]    [Pg.889]    [Pg.218]    [Pg.218]    [Pg.889]    [Pg.454]    [Pg.455]    [Pg.454]    [Pg.455]    [Pg.404]    [Pg.323]   
See also in sourсe #XX -- [ Pg.650 ]




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Hexaboride

Hexaborides

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