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Silicon electrical testing performance

Figure 5. Triple-track resistor electrical testing performance of crown ethers in commercial RTV silicon encapsulants. Conditions bias, 180 V relative humidity, 96% temperature, 100°C. Figure 5. Triple-track resistor electrical testing performance of crown ethers in commercial RTV silicon encapsulants. Conditions bias, 180 V relative humidity, 96% temperature, 100°C.
Actually there are defined no minimum requirements for the stability or the dynamics of the hydrophobicity of silicone elastomers. The presently existing knowledge has been achieved from long-time field and laboratory tests. Because of the complexity of the stress factors, the results are not always comparable. Thus, systematic laboratory experiments have to be performed to be able to validate the influence of different material parameters. This paper deals with experiments on the influence of single stress parameters on the hydrophobicity. The results are compared with the electrical behavior of droplet layers on the silicone mbber surfaces. [Pg.771]

Power discrete devices typically function as a switch and as such most high-power applications require these devices to be low in resistance to minimize heat and current load as well as optimize Vsd and Rdson. As with prior test, the Ta/Cu backmetal had no significant impact on Vsd or Rdson as compared to the control group. Since the Ta/Cu was not examined for electrical benefits but for stress benefits, there is only a need for it to be equivalent to the standard metal scheme in the electrical and parameteric performance. These results confirm that since the metal schemes evaluated behave in a similar manner, the bulk silicon resistance is the dominant factor in determining Vsd and Rdson of the device. [Pg.190]

Prototype Efficiency Measurements. A variety of LSC devices have been tested by ourselves and others. Table I is Intended to be a representative list of typical performance parameters. Again, the geometric gain is the ratio of the area exposed to the sun to the active area of the edge. The flux gain is the factor by which the short circuit current increased when attached to the plate, as opposed to facing the sun directly. The cell efficiency is the measured or assumed AMI efficiency of the solar cells used (which in all cased were silicon). The collector efficiency is the total electrical power out divided by the total sunlight power incident on the plate. [Pg.346]

Accordingly, the nitroaniline OPE was tested in the nanopore, in the absence of an orthogonal external electric field, to determine its electronic characteristics. A series of control experiments were first performed with alkanethiol-derived SAMs and systems containing no molecules. Both the Au-alkanethiolate-Au junctions and the Au-silicon nitride membrane-Au junctions showed current levels at the noise limit of the apparatus (< 1 pA) for both bias polarities at both room and low temperatures. The Au-Au junctions gave... [Pg.242]

Fig. 2 Process flow (a) Starting Material, (b)Deposit SisN (c)Deposit poly-silicon, (d) Deposit Al, (e) Resist coating, (f) Soft bake, (g) Exposure mask, (h) Develop resist (i) Poly-silicon RIE, (j) Alum etch and stripe resist, ion(k) Dry oxidation, (1) Poly-silicon nanogap pattern with pad Pt/Au fabrication( Electrical checking of the device can be performed on the fabricated pad)(Repeat step (a) to (j) for mask 2). Fig. 3 shows the circuit after serial impedance is measured, a simple resistor model is developed representing the substrate and polysilicon layer. The capacitor also found in series to describe the device with no liquid test... Fig. 2 Process flow (a) Starting Material, (b)Deposit SisN (c)Deposit poly-silicon, (d) Deposit Al, (e) Resist coating, (f) Soft bake, (g) Exposure mask, (h) Develop resist (i) Poly-silicon RIE, (j) Alum etch and stripe resist, ion(k) Dry oxidation, (1) Poly-silicon nanogap pattern with pad Pt/Au fabrication( Electrical checking of the device can be performed on the fabricated pad)(Repeat step (a) to (j) for mask 2). Fig. 3 shows the circuit after serial impedance is measured, a simple resistor model is developed representing the substrate and polysilicon layer. The capacitor also found in series to describe the device with no liquid test...

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Electrical tests

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