Secondary Screening of High Surface Area Electrocatalysts

Secondary Screening of High Surface Area Electrocatalysts 

Primary thin film hits , i.e., optimized catalyst compositions determined during one or more primary screening cycles as represented in Fig. 11.8, are examined in 

Structural and compositional characterization of high surface-area catalysts is crucial for evaluating whether the secondary synthesis of a particular electrocatalyst was successful. Similar to the primary screening workflow, XRD is used for the structural characterization of catalyst powders, while SEM/EDX is employed for the compositional characterization of electrocatalyst powders before and after electrochemical screening. 

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