Scientific Goals of Line Profile Analysis

Profound line profile analysis is possible if a set of reflections is observed, i.e., peaks from several crystallographic orders indexed by (/t) are accessible. With respect to a principal refiection found at the position y(i) the positions of the higher orders are 

To have a set of only two peaks accessible may be sufficient, if additional parameters are varied (temperature [110], pressure [111]). 

Both for isotropic and anisotropic scattering patterns line profile analysis can be performed. If a curve from an anisotropic pattern is analyzed, the results are limited 

Line breadths are the fundamental quantities in this field of polymer analysis. As a consequence of the Fourier relation between structure and scattering these breadths are integral breadths, not full widths at half-maximum (FWHM). 

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