Schematic diagram LEED

Fig. 2.45. Schematic diagram of a four-grid LEED display system [2.243],...

Fig. 2. Schematic diagram of a high resolution He time-of-flight spectrometer. N-nozzle beam source, SI, 2-skimmers, Al-5 - apertures, T - sample, G - gas doser, CMA - Auger Spectrometer, IG - ion gun, L - LEED, C -magnetically suspended pseudorandom chopper, QMA-detector, quadrupole mass analyzer with channeltron.

Figure 1.1. Schematic diagram showing the electron elastic scattering pathways contributing to the techniques of low energy electron diffraction (LEED), backscattering photoelectron diffraction (including the scanned-energy mode - PhD) and surface extended X-ray absorption fine structure (SEXAFS). Black disks represent substrate atoms, grey-shaded disks represent adsorbate atoms.

Figure 2 Schematic diagram of a video LEED system used to generate intensity versus voltage curves of electrons diffracted from ordered surfaces. The I -V curves are compared to theory in solving a surface structure...

Figure 4 shows a schematic diagram of an ultrahigh vacuum (5 x 10 ° Torr) apparatus that integrates LEED, XPS, TPD, LEISS, and electrochemistiy (EC). The base pressure of the chamber is 5 x 10" Torr. The sample is mounted on a probe, a tube fabricated out of stainless steel, at the top of the chamber. The probe allows experiments to be performed at very low temperatures for example, the probe is filled with hquid nitrogen for experiments at 77 K. The sample can also be heated resistively (up to 1500 K) via copper wires attached to the sample for still higher temperatures, an electron beam from a tungsten wire located behind the sample is employed. Temperature is monitored via a ReAV-Re thermocouple. 

Figiffe 4. Schematic diagram of an integrated LEED-TPD-XPS-LEISS-EC apparatus. 

Fig. 8. Schematic diagram of a LEED-AES-electrochemical system using a glove box [28].

Figure 17.3.13 Schematic diagram of a LEED apparatus. [From G. A. Somorjai and H. H. Farrell, Adv. Chem. Phys., 20, 215 (1971), with permission.]...

Fig. 7.1. Schematic diagram of the TOF-ESD microscopy system, termed the protoscope . A pencil-type electron gun for SEM and conventional low energy electron diffraction (LEED) gun for LEED, Auger electron spectroscopy (AES), and (electron stimulated desorption ion angular distribution (ESDIAD) are combined with an ion detector consisting of microchannel plates (MCPs) and a phosphor screen.

Fig. 16. LEED diagram observed for the (1x2) reconstructed Au(llO) surface (130 eV electron energy) and schematic representation of the corresponding missing row reconstruction.

Experiments were carried out in the simulator on an early form of Freeman-Swanson Knee Joint and on a Leeds Knee Joint. Distilled water was allowed to drip onto the prosthesis to wet the interface, the flow rate being adjusted to maintain temperature of the tlbial component at 37 C. Contour diagrams based upon holography are recorded for the initial and worn tlbial components of each joint in Figures 3 and 4 and schematic representations of the wear scars are shown in Figures 5 and 6. 

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