Scanning probe microscopy, inorganic

The potential applications of inorganic nanotubes as tips for scanning probe microscopy for the study of soft tissue rough surfaces and for nanolithography is further discussed in this chapter (Section VI). Most importantly, these kinds of nanoparticles exhibit interesting tribological properties, which are briefly discussed. 

Another important field where inorganic nanotubes can be useful is as tips in scanning probe microscopy (16). Here, applications in the inspection of microelectronics circuitry have been demonstrated and potential applications in nanolithography are being contemplated. A comparison between a WS2 nanotube tip and a microfabricated Si tip indicates that while the microfabricated conical-shaped Si tip is unable to probe the bottom of deep and narrow grooves, the slender and inert... 

Although the mechanical properties of inorganic nanotubes have not been investigated in detail so far, very good tips for scanning probe microscopy have been prepared from WS2 nanotubes [24]. Their mechanical and chemical stability is attributed to their structural perfection and rigidity. Recent data indicates that BN nanotubes exhibit Young modulus in par with carbon nanotubes [25]. This is... 

Inorganic nanotubes derived from WS2 may find application as tips in scanning probe microscopy. The feasibility of using such tips in inspecting microelectronic circuitry has now been demonstrated. The tips produced from WS2 nanotubes can outperform the microfabricated Si tip counterparts with respect to resilience and surface passivity [107]. Additional advantages of WS2 nanotubes include tunable electrical conductivities and strong light absorption in the visible spectrum. These properties may provide additional application opportunities in areas such as nanoelectronics and photocatalysis. 

The electron microscopes can be divided into two types (166) scanning electron microscopes (SEM), which use a 10-nm electron beam at the specimen surface, and transmission electron microscopes (TEM). With current TEMs, resolution of about 0.2 nm can be achieved, provided very thin (<20 nm) samples are available. With conventional inorganic oxide-supported metal catalysts, particles of approximately 1 nm can be detected. Scanning transmission electron microscopes (STEM) use a high brightness dark-field emission gun to produce a probe about 0.3 nm in diameter and combine the techniques of SEM and TEM. Further experimental and theoretical aspects of electron microscopy applied to catalysis have been reviewed recently (113, 167-169). 

---