Scanning photo-induced impedance microscopy

S. Krause, H. Talabani, M. Xu, W. Moritz and J. Griffiths, Scanning photo-induced impedance microscopy—an impedance based imaging technique, Electrochim. Acta, 47(13-14) (2002) 2143-2148. 

Scanning Photo-induced Impedance Microscopy (SPIM)... 

Another impedance-based imaging technique for laterally resolved characterization of thin films or electrochemical systems is Scanning Photo-induced Impedance Microscopy (SPIM) [44]. It is based on photocurrent measurements at field-effect structures. In their simplest arrangement, field-effect structures consist of a semiconductor substrate with a thin insulator, and a gate electrode. This gate electrode can be a metal film resulting in the structure Metal Insulator Semiconductor (MIS) or, alternatively. Electrolyte Insulator Semiconductor structures are used, in which the electrolyte is in direct contact with the insulator, and a reference electrode is required to fulfill the function of the gate electrode. 

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