Scanning electron microscopy embedding techniques

The composites as well as the nanowires were characterized by several techniques. Scanning electron microscopy (SEM) images and energy dispersive analysis of x-rays (EDAX) were obtained with a Leica S-440I microscope fitted with a Link ISIS spectrometer. Infrared (IR) spectra were recorded on small pieces of the samples embedded in KBr pellets using a Broker FT-IR spectrometer. DSC was carried out on the samples ( 7 mg) with a scanning rate of 20 K min-1 between 120 and 260 °C using a Mettler-Toledo DSC. 

A new method for preparing thin rubber sheet embedded with Ti02 from NR latex has been developed by ChavalSriwong et The characteristics of this thin and flexible Ti02 sheet were studied by X-ray diffraction (XRD) and scanning electron microscopy/energy-dispersive X-ray spectrometer (SEM/ EDS) techniques. 

TTHIS CHAPTER IS FOR INDIVIDUALS who have not done electron microscopy (EM) before, but it also contains some new information about specimen preparation that can benefit experienced electron microscopists. It covers the materials and methods necessary to do routine thin sections of embedded specimens however, it does not cover specialized EM techniques such as freeze-fracture, rotary shadowing, negative staining, scanning EM, and serial sectioning. Likewise, this chapter focuses mainly on embryos because a description of the fixation methods for all the various types of fly tissues would require an entire book. This chapter is divided into three main sections ... 

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