Scanning electron microscopy conductive coating deposition

Quahty control. The quahty of matrix deposition on ITO-coated glass is characterized by scanning electron microscopy of the surface. To avoid disturbance of the matrix layer, the SEM analysis is conducted without any additional coating using a variable pressure instrument see Note 9, Fig. 24.1a, b). 

Sample preparation for scanning electron microscopy is very simple, and microtomed sections are not very practical. One merely has to take the same as is—fractured surface—torn surface — whatever it may be, and apply a vacuum deposited layer of a conductive metal if the rubber is not conductive, and the sample is ready for examination. If the rubber contains a reinforcing amount of carbon black, even the conductive coating is not necessary. Adhesion can be assessed using the scanning electron microscope. This is based on whether or not one can see air between phases after the desired test has been conducted. This has been demonstrated many times in the fiber-reinforced resin systems. 

Scanning electrochemical microscopy (SECM), which has an intermediate resolution between that of conventional lithography and AFM/STM, is useful for mapping the electrochemically active areas of electronically conductive patterns of the films [38] it also can be used for the special mode of coating of the surface of metallic electrodes with ECP films by electroless deposition [39]. 

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